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The net entropy change corresponding to the charge carriers in a Ni-doped FeRh bulk polycrystal was experimentally evaluated in a single sample using low temperature heat capacity experiments with applied magnetic field, and using Seebeck effect and Hall coefficient measurements at high temperatures across the first order transition. From the heat capacity data a value for the electronic entropy change (Delta S_{el}approx8.9) J kg(^{-1})K(^{-1}) was extracted, whereas a value of up to 4 J kg(^{-1})K(^{-1}) was obtained form the Seebeck coefficient. Additionally, the analysis of the Seebeck coefficient allows tracing the evolution of the electronic entropy change with applied magnetic field. An increase of the electronic entropy with increasing applied magnetic field is evidenced, as high as 10 percent at 6 T.
We present results of comprehensive study of electronic properties of (TiZrNbCu)(1-x)Ni(x) metallic glasses performed in broad composition range x encompassing both, high entropy (HE) range, and conventional Ni-base alloy concentration range, x >= 0.
The Seebeck coefficients, electrical resistivities, total thermal conductivities, and magnetization are reported for temperatures between 5 and 350 K for n-type Bi0.88Sb0.12 nano-composite alloys made by Ho-doping at the 0, 1 and 3% atomic levels. Th
The impact of epitaxial strain on the structural, electronic, and thermoelectric properties of p-type transparent Sr-doped LaCrO3 thin films has been investigated. For this purpose, high-quality fully strained La0.75Sr0.25CrO3 (LSCO) epitaxial thin f
Using X-ray photoelectron emission microscopy we have observed the coexistence of ferromagnetic and antiferromagnetic phases in a (3 at.%)Pd-doped FeRh epilayer. By quantitatively analyzing the resultant images we observe that as the epilayer transfo
Spin-wave resonance measurements were performed in the mixed magnetic phase regime of a Pd-doped FeRh epilayer that appears as the first-order ferromagnetic-antiferromagnetic phase transition takes place. It is seen that the measured value of the exc