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The control of the optical quality of a laser beam requires a complex amplitude measurement able to deal with strong modulus variations and potentially highly perturbed wavefronts. The method proposed here consists in an extension of phase diversity to complex amplitude measurements that is effective for highly perturbed beams. Named CAMELOT for Complex Amplitude MEasurement by a Likelihood Optimization Tool, it relies on the acquisition and processing of few images of the beam section taken along the optical path. The complex amplitude of the beam is retrieved from the images by the minimization of a Maximum a Posteriori error metric between the images and a model of the beam propagation. The analytical formalism of the method and its experimental validation are presented. The modulus of the beam is compared to a measurement of the beam profile, the phase of the beam is compared to a conventional phase diversity estimate. The precision of the experimental measurements is investigated by numerical simulations.
A peculiar radiation arising as a result of radiation interference of nonlinear oscillators excited by a monochromatic plane wave field of the incident particle is described. The radiation properties are determined by the fact that a phase of each os
We have designed a plenoptic sensor to retrieve phase and amplitude changes resulting from a laser beams propagation through atmospheric turbulence. Compared with the commonly restricted domain of (-pi, pi) in phase reconstruction by interferometers,
Many areas of optical science require an accurate measurement of optical spectra. Devices based on laser speckle promise compact wavelength measurement, with attometer-level sensitivity demonstrated for single wavelength laser fields. The measurement
When a photo-diode is illuminated by a pulse train from a femtosecond laser, it generates microwaves components at the harmonics of the repetition rate within its bandwidth. The phase of these components (relative to the optical pulse train) is known
Focused ion beam (FIB) microscopy suffers from source shot noise - random variation in the number of incident ions in any fixed dwell time - along with random variation in the number of detected secondary electrons per incident ion. This multiplicity