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In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-a-chip (SoC) environments. The approach advantages are the ability to protect the core IP, the simple test interface (thanks also to the adoption of the P1500 standard), the possibility to run the test at-speed, the reduced test time, and the good diagnostic capabilities. The paper reports figures about the achieved fault coverage, the required area overhead, and the performance slowdown, and compares the figures with those for alternative approaches, such as those based on full scan and sequential ATPG.
This paper describes a flexible logic BIST scheme that features high fault coverage achieved by fault-simulation guided test point insertion, real at-speed test capability for multi-clock designs without clock frequency manipulation, and easy physica
Field programmable gate arrays (FPGAs) provide designers with the ability to quickly create hardware circuits. Increases in FPGA configurable logic capacity and decreasing FPGA costs have enabled designers to more readily incorporate FPGAs in their d
In this work, a novel quaternary algebra has been proposed that can be used to implement an arbitrary quaternary logic function in more than one systematic ways. The proposed logic has evolved from and is closely related to the Boolean algebra for bi
Three-dimensional (3D)-stacking technology, which enables the integration of DRAM and logic dies, offers high bandwidth and low energy consumption. This technology also empowers new memory designs for executing tasks not traditionally associated with
Use case scenarios are created during the analysis phase to specify software system requirements and can also be used for creating system level test cases. Using use cases to get system tests has several benefits including test design at early stages