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Measurement of the Tip-Induced Potential in Scanning Gate Experiments

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 Added by Arnd Gildemeister
 Publication date 2007
  fields Physics
and research's language is English




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We present a detailed experimental study on the electrostatic interaction between a quantum dot and the metallic tip of a scanning force microscope. Our method allowed us to quantitatively map the tip-induced potential and to determine the spatial dependence of the tips lever arm with high resolution. We find that two parts of the tip-induced potential can be distinguished, one that depends on the voltage applied to the tip and one that is independent of this voltage. The first part is due to the metallic tip while we interpret the second part as the effect of a charged dielectric particle on the tip. In the measurements of the lever arm we find fine structure that depends on which quantum state we study. The results are discussed in view of scanning gate experiments where the tip is used as a movable gate to study nanostructures.



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We present conductance measurements of a ballistic circular stadium influenced by a scanning gate. When the tip depletes the electron gas below, we observe very pronounced and regular fringes covering the entire stadium. The fringes correspond to transmitted modes in constrictions formed between the tip-induced potential and the boundaries of the stadium. Moving the tip and counting the fringes gives us exquisite control over the transmission of these constrictions. We use this control to form a quantum ring with a specific number of modes in each arm showing the Aharonov-Bohm effect in low-field magnetoconductance measurements.
In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and interpretation of the measurements. Contaminations picked up during topography scans may significantly alter this potential. We present an in situ high-field treatment of the tip that improves the tip-induced potential. A quantum dot was used to measure the tip-induced potential.
An open resonator fabricated in a two-dimensional electron gas is used to explore the transition from strongly invasive scanning gate microscopy to the perturbative regime of weak tip-induced potentials. With the help of numerical simulations that faithfully reproduce the main experimental findings, we quantify the extent of the perturbative regime in which the tip-induced conductance change is unambiguously determined by properties of the unperturbed system. The correspondence between the experimental and numerical results is established by analyzing the characteristic length scale and the amplitude modulation of the conductance change. In the perturbative regime, the former is shown to assume a disorder-dependent maximum value, while the latter linearly increases with the strength of a weak tip potential.
Using the tip of a scanning probe microscope as a local electrostatic gate gives access to real space information on electrostatics as well as charge transport at the nanoscale, provided that the tip-induced electrostatic potential is well known. Here, we focus on the accurate characterization of the tip potential, in a regime where the tip locally depletes a two-dimensional electron gas (2DEG) hosted in a semiconductor heterostructure. Scanning the tip in the vicinity of a quantum point contact defined in the 2DEG, we observe Fabry-Perot interference fringes at low temperature in maps of the device conductance. We exploit the evolution of these fringes with the tip voltage to measure the change in depletion radius by electron interferometry. We find that a semi-classical finite-element self-consistent model taking into account the conical shape of the tip reaches a faithful correspondence with the experimental data.
152 - P. Liu , F. Martins , B. Hackens 2015
The disordered potential landscape in an InGaAs/InAlAs two-dimensional electron gas patterned into narrow wires is investigated by means of scanning gate microscopy. It is found that scanning a negatively charged tip above particular sites of the wires produces conductance oscillations that are periodic in the tip voltage. These oscillations take the shape of concentric circles whose number and diameter increase for more negative tip voltages until full depletion occurs in the probed region. These observations cannot be explained by charging events in material traps, but are consistent with Coulomb blockade in quantum dots forming when the potential fluctuations are raised locally at the Fermi level by the gating action of the tip. This interpretation is supported by simple electrostatic simulations in the case of a disorder potential induced by ionized dopants. This work represents a local investigation of the mechanisms responsible for the disorder-induced metal-to-insulator transition observed in macroscopic two-dimensional electron systems at low enough density.
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