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Cu $K$-edge Resonant Inelastic X-Ray Scattering in Edge-Sharing Cuprates

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 Added by Thomas Devereaux
 Publication date 2007
  fields Physics
and research's language is English




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We present calculations for resonant inelastic x-ray scattering (RIXS) in edge-shared copper oxide systems, such as CuGeO$_{3}$ and Li$_{2}$CuO$_{2}$, appropriate for hard x-ray scattering where the photoexcited electron lies above oxygen 2p and copper 3d orbital energies. We perform exact diagonalizations of the multi-band Hubbard and determine the energies, orbital character and resonance profiles of excitations which can be probed via RIXS. We find excellent agreement with recent results on Li$_{2}$CuO$_{2}$ and CuGeO$_{3}$ in the 2-7 eV photon energy loss range.



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We report a Cu K-edge resonant inelastic x-ray scattering (RIXS) study of momentum-dependent charge excitations in Nd$_{2-x}$Ce$_x$CuO$_4$ ($x$ = 0.075 and 0.18). The peak position and width of the excitations coincide excellently with those observed in Cu L$_3$-edge RIXS. It demonstrates that the same charge excitations are observed at the two edges.
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We investigate electronic excitations in La2-x(Br,Sr)xCuO4 using resonant inelastic x-ray scattering (RIXS) at the oxygen K edge. RIXS spectra of the hole-doped cuprates show clear momentum dependence below 1 eV. The spectral weight exhibits positive dispersion and shifts to higher energy with increasing hole concentration. Theoretical calculation of the dynamical charge structure factor on oxygen orbitals in a three-band Hubbard model is consistent with the experimental observation of the momentum and doping dependence, and therefore the dispersive mode is ascribed to intraband charge excitations which have been observed in electron-doped cuprates.
501 - C.-C. Chen , B. Moritz , F. Vernay 2010
Results of model calculations using exact diagonalization reveal the orbital character of states associated with different Raman loss peaks in Cu $K$-edge resonant inelastic X-ray scattering (RIXS) from La$_{2}$CuO$_{4}$. The model includes electronic orbitals necessary to highlight non-local Zhang-Rice singlet, charge transfer and $d$-$d$ excitations, as well as states with apical oxygen 2$p_z$ character. The dispersion of these excitations is discussed with prospects for resonant final state wave-function mapping. A good agreement with experiments emphasizes the substantial multi-orbital character of RIXS profiles in the energy transfer range 1-6 eV.
The coupling between lattice and charge degrees of freedom in condensed matter materials is ubiquitous and can often result in interesting properties and ordered phases, including conventional superconductivity, charge density wave order, and metal-insulator transitions. Angle-resolved photoemission spectroscopy and both neutron and non-resonant x-ray scattering serve as effective probes for determining the behavior of appropriate, individual degrees of freedom -- the electronic structure and lattice excitation, or phonon dispersion, respectively. However, each provides less direct information about the mutual coupling between the degrees of freedom, usual through self-energy effects, which tend to renormalize and broaden spectral features precisely where the coupling is strong, impacting ones ability to quantitively characterize the coupling. Here we demonstrate that resonant inelastic x-ray scattering, or RIXS, can be an effective tool to directly determine the relative strength and momentum dependence of the electron-phonon coupling in condensed matter systems. Using a diagrammatic approach for an 8-band model of copper oxides, we study the contributions from the lowest order diagrams to the full RIXS intensity for a realistic scattering geometry, accounting for matrix element effects in the scattering cross-section as well as the momentum dependence of the electron-phonon coupling vertex. A detailed examination of these maps offers a unique perspective into the characteristics of electron-phonon coupling, which complements both neutron and non-resonant x-ray scattering, as well as Raman and infrared conductivity.
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