X-ray Polarimetry is almost as old as X-ray Astronomy. Since the first discovery of X-ray sources theoretical analysis suggested that a high degree of linear polarization could be expected due either to the, extremely non thermal, emission mechanism or to the transfer of radiation in highly asymmetric systems. The actual implementation of this subtopic was, conversely, relatively deceiving. This is mainly due to the limitation of the conventional techniques based on the Bragg diffraction at 45deg, or on Thomson scattering around 90deg. Acually no X-ray Polarimeter has been launched since 25 years. Nevertheless the expectations from such measurement on several astrophysical targets including High and Low Mass X-Ray Binaries, isolated neutron Stars, Galactic and Extragalactic Black Holes is extremely attractive. We developed a new technique to measure the linear polarization of X-ray sources. It is based on the visualization of photoelectron tracks in a, finely subdivided, gas filled detector (micropattern). The initial direction of the photoelectron is derived and from the angular distribution of the tracks the amount and angle of polarization is computed. This technique can find an optimal exploitation in the focus of XEUS-1. Even in a very conservative configuration (basically the already existing prototype) the photoelectric polarimeter could perform polarimetry at % level on many AGNs. Further significant improvements can be expected from a technological development on the detector and with the use of XEUS-2 telescope.
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