Measurement of the miscut angle in the determination of the Si lattice parameter


Abstract in English

The measurement of the angle between the interferometer front mirror and the diffracting planes is a critical aspect of the Si lattice-parameter measurement by combined x-ray and optical interferometry. In addition to being measured off-line by x-ray diffraction, it was checked on-line by transversely moving the analyser crystal and observing the phase shift of the interference fringe. We describe the measurement procedure and give the miscut angle of the $^{28}$Si crystal whose lattice parameter was an essential input-datum for, yesterday, the determination of the Avogadro constant and, today, the kilogram realisation by counting atoms. These data are a kindness to others that might wish to repeat the measurement of the lattice-parameter of this unique crystal.

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