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Register a new userMultiband Weighting of X-ray Polarization Data
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Authors
Herman L. Marshall
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An optimal estimate for Stokes parameters is derived for the situation in X-ray astronomy where the instrument has a modulation factor that varies significantly with energy but the signals are very weak or mildly polarized. For such sources, the band of analysis may be broadened in order to obtain a significant polarization measurement. Optimal estimators are provided for the cases of binned and unbinned data and applied to data such as might be obtained for faint or weakly polarized sources observed using the Imaging X-ray Polarimetry Explorer (IXPE). For a sample situation, the improvement in the minimum detectable polarization is 6-7% using a count weighted root-mean-square of the modulation factor, when compared to a count weighted average. Improving the modulation factor, such as when using a neural network approach to IXPE event tracks, can provide additional improvement up to 10-15%. The actual improvement depends on the spectral shape and the details of the instrument response functions.
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One of the difficulties with performing polarization analysis is that the mean polarization fraction of sub-divided data sets is larger than the polarization fraction for the integrated measurement. The resulting bias is one of the properties of the generating distribution discussed in this work. The limitations of Gaussian approximations in standard analysis based on Stokes parameters for estimating polarization parameters and their uncertainties are explored by comparing with a Bayesian analysis. Different signal-to-background scenarios are considered making the analysis relevant for a large variety of observations. The effect of uncertainty on the modulation factor is also shown, since it can have a large impact on the performance of gamma-ray burst polarimeters. Results are related to the minimum detectable polarization (MDP), a common figure of merit, making them easily applicable to any X-ray polarimeter.
The X-ray Polarization Probe (XPP) is a second generation X-ray polarimeter following up on the Imaging X-ray Polarimetry Explorer (IXPE). The XPP will offer true broadband polarimetery over the wide 0.2-60 keV bandpass in addition to imaging polarimetry from 2-8 keV. The extended energy bandpass and improvements in sensitivity will enable the simultaneous measurement of the polarization of several emission components. These measurements will give qualitatively new information about how compact objects work, and will probe fundamental physics, i.e. strong-field quantum electrodynamics and strong gravity.
This paper describes the Polarization Spectroscopic Telescope Array (PolSTAR), a mission proposed to NASAs 2014 Small Explorer (SMEX) announcement of opportunity. PolSTAR measures the linear polarization of 3-50 keV (requirement; goal: 2.5-70 keV) X-rays probing the behavior of matter, radiation and the very fabric of spacetime under the extreme conditions close to the event horizons of black holes, as well as in and around magnetars and neutron stars. The PolSTAR design is based on the technology developed for the Nuclear Spectroscopic Telescope Array (NuSTAR) mission launched in June 2012. In particular, it uses the same X-ray optics, extendable telescope boom, optical bench, and CdZnTe detectors as NuSTAR. The mission has the sensitivity to measure ~1% linear polarization fractions for X-ray sources with fluxes down to ~5 mCrab. This paper describes the PolSTAR design as well as the science drivers and the potential science return.
Astronomical data generally consists of 2 or more high-resolution axes, e.g., X,Y position on the sky or wavelength and position-along-one-axis (long-slit spectrometer). Analyzing these multi-dimension observations requires combining 3D source models (including velocity effects), instrument models, and multi-dimensional data comparison and fitting. A prototype of such a Beyond-XSPEC (Noble & Nowak, 2008) system is presented here using Chandra imag- ing and dispersed HETG grating data. Techniques used include: Monte Carlo event generation, chi-squared comparison, conjugate gradient fitting adapted to the Monte Carlo characteristics, and informative visualizations at each step. These simple baby steps of progress only scratch the surface of the computational potential that is available these days for astronomical analysis.
The prospects for accomplishing x-ray polarization measurements of astronomical sources have grown in recent years, after a hiatus of more than 37 years. Unfortunately, accompanying this long hiatus has been some confusion over the statistical uncertainties associated with x-ray polarization measurements of these sources. We have initiated a program to perform the detailed calculations that will offer insights into the uncertainties associated with x-ray polarization measurements. Here we describe a mathematical formalism for determining the 1- and 2-parameter errors in the magnitude and position angle of x-ray (linear) polarization in the presence of a (polarized or unpolarized) background. We further review relevant statistics-including clearly distinguishing between the Minimum Detectable Polarization (MDP) and the accuracy of a polarization measurement.
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