Bayesian Modelling of Pattern Formation from One Snapshot of Pattern


Abstract in English

Partial differential equations (PDE) have been widely used to reproduce patterns in nature and to give insight into the mechanism underlying pattern formation. Although many PDE models have been proposed, they rely on the pre-request knowledge of physical laws and symmetries, and developing a model to reproduce a given desired pattern remains difficult. We propose a novel method, referred to as Bayesian modelling of PDE (BM-PDE), to estimate the best PDE for one snapshot of a target pattern under the stationary state. We show the order parameters extracting symmetries of a pattern together with Bayesian modelling successfully estimate parameters as well as the best model to make the target pattern. We apply BM-PDE to nontrivial patterns, such as quasi-crystals, a double gyroid and Frank Kasper structures. Our method works for noisy patterns and the pattern synthesised without the ground truth parameters, which are required for the application toward experimental data.

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