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Register a new userUnderstanding the image contrast of material boundaries in IR nanoscopy reaching 5 nm spatial resolution
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Scattering-type scanning near-field optical microscopy (s-SNOM) allows for nanoscale resolved Infrared (IR) and Terahertz (THz) imaging, and thus has manifold applications ranging from materials to biosciences. However, a quantitatively accurate understanding of image contrast formation at materials boundaries, and thus spatial resolution is a surprisingly unexplored terrain. Here we introduce the write/read head of a commercial hard disk drive (HDD) as a most suitable test sample for fundamental studies, given its well20 defined sharp material boundaries perpendicular to its ultra-smooth surface. We obtainunprecedented and unexpected insights into the s-SNOM image formation process, free of topography-induced artifacts that often mask and artificially modify the pure near-field optical contrast. Across metal-dielectric boundaries, we observe non-point-symmetric line profiles for both IR and THz illumination, which are fully corroborated by numericalsimulations. We explain our findings by a sample-dependent confinement and screening of the near fields at the tip apex, which will be of crucial importance for an accurate understanding and proper interpretation of high-resolution s-SNOM images of nanocomposite materials. We also demonstrate that with ultra-sharp tungsten tips the apparent width (and thus resolution) of sharp material boundaries can be reduced to about 5 nm.
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We report a very high precision interferometric sensor with resolution up to ~{lambda}/1024, exploiting hollow photonic bandgap waveguide-based geometry for the first time. Here sensing has been measured by a complete switching in the direction of the outgoing beam, owing to transverse momentum oscillation phenomena. Using a 1.32 {mu}m source and core-width of 7.25 {mu}m, a complete switching cycle is obtained even due to a small change of ~1 nm in the core-width. Using hollow-core photonic bandgap waveguide, Talbot effect, revivals of the initial phase, oscillation in the transverse momentum along with multi-mode interference served as the backbone of the design. The ultra-sensitive multi-mode interferometric sensor based on photonic crystals will certainly open up a paradigm shift in interferometer-based sensing technologies toward device-level applications in photonic sensing/switching and related precision measurement systems.
Silicon waveguides have enabled large-scale manipulation and processing of near-infrared optical signals on chip. Yet, expanding the bandwidth of guided waves to other frequencies would further increase the functionality of silicon as a photonics platform. Frequency multiplexing by integrating additional architectures is one approach to the problem, but this is challenging to design and integrate within the existing form factor due to scaling with the free-space wavelength. Here, we demonstrate that a hexagonal boron nitride (hBN)/silicon hybrid waveguide can enable dual-band operation at both mid-infrared (6.5-7.0 um) and telecom (1.55 um) frequencies, respectively. Our device is realized via lithography-free transfer of hBN onto a silicon waveguide, maintaining near-infrared operation, while mid-infrared waveguiding of the hyperbolic phonon polaritons (HPhPs) in hBN is induced by the index contrast between the silicon waveguide and the surrounding air, thereby eliminating the need for deleterious etching of the hBN. We verify the behavior of HPhP waveguiding in both straight and curved trajectories, and validate their propagation characteristics within an analytical waveguide theoretical framework. This approach exemplifies a generalizable approach based on integrating hyperbolic media with silicon photonics for realizing frequency multiplexing in on-chip photonic systems.
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