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Register a new userStudies of the delayed discharge propagation in the Gas Electron Multiplier (GEM)
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This paper presents an investigation of the discharge propagation (DP) to the readout electrode that occurs with a microsecond time delay after a primary discharge that develops inside a GEM foil hole. A single hole THGEM (THick GEM) foil that enables a controlled discharge position and the induction of primary discharge with an over-voltage in the THGEM foil has been used in the initial DP measurements. In order to justify the use of a custom-made THGEM foil, additional measurements were made with a standard GEM foil. Correlated optical (with an ordinary SLR and a high-speed camera) and electrical measurements of the delayed DP were made for Ne-CO$_2$-N$_2$ (90-10-5) mixture and with different powering configurations. Measurements show that the delayed DP happens without a drift field, with an inverted induction field, inverted THGEM voltages or an inverted drift field. After the primary discharge, there is a charge transfer in the induction region at an induction field value below that of the onset field for DP. In the time between the primary discharge and the delayed DP, three different current regimes are observed, which suggests multiple charge transfer mechanisms in the induction region. High-speed camera recordings provide valuable insight into the time evolution of the primary and the delayed DP, especially when correlated with electrical measurements.
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A prototype Gas Electron Multiplier (GEM) detector is under construction for medical imaging purposes. A single thick GEM of size 10x10 cm^2 is assembled inside a square shaped air-tight box which is made of Perspex glass. In order to ionize gas inside the drift field two types of voltage supplier circuits were fabricated, and array of 2x4 pads of each size 4x8 mm^2 were utilized for collecting avalanche charges. Preliminary testing results show that the circuit which produces high voltage and low current is better than that of low voltage and high current supplier circuit in terms of x-ray signal counting rates.
Secondary discharges, which consist of the breakdown of a gap near a GEM foil upon a primary discharge across that GEM, are studied in this work. Their main characteristics are the occurrence a few $10,mu textrm{s}$ after the primary, the relatively sharp onset at moderate electric fields across the gap, the absence of increased fields in the system, and their occurrence under both field directions. They can be mitigated using series resistors in the high-voltage connection to the GEM electrode facing towards an anode. The electric field at which the onset of secondary discharges occurs indeed increases with increasing resistance. Discharge propagation form GEM to GEM in a multi-GEM system affects the occurrence probability of secondary discharges in the gaps between neighbouring GEMs. Furthermore, evidence of charges flowing through the gap after the primary discharge are reported. Such currents may or may not lead to a secondary discharge. A characteristic charge, of the order of $10^{10},textrm{electrons}$, has been measured as the threshold for a primary discharge to be followed by a secondary discharge, and this number slightly depends on the gas composition. A mechanism involving the heating of the cathode surface as trigger for secondary discharges is proposed.
We present the results of our recent studies of a Thick Gaseous Electron Multiplier (THGEM)-based detector, operated in Ar, Xe and Ar:Xe (95:5) at various gas pressures. Avalanche-multiplication properties and energy resolution were investigated with soft x-rays for different detector configurations and parameters. Gains above 10E4 were reached in a double-THGEM detector, at atmospheric pressure, in all gases, in almost all the tested conditions; in Ar:Xe (95:5) similar gains were reached at pressures up to 2 bar. The energy resolution dependence on the gas, pressure, hole geometry and electric fields was studied in detail, yielding in some configurations values below 20% FWHM with 5.9 keV x-rays.
Gas electron multiplier (GEM) is widely used in modern gas detectors of ionizing radiation in experiments on high-energy physics at accelerators and in other fields of science. Typically the GEM devices are based on a dielectric foil with holes and electrodes on both sides. GEMs made by radiation-hard dielectrics or wide band-gap semiconductors are desirable for some applications. The results of the first tests of the gas electron multiplier made of radiation-hard materials, such as polycrystalline CVD diamond with a thickness of 100 microns is described. Here we report on fabrication of GEM based on free-standing polycrystalline CVD diamond film and its first test.
We investigate the influence of the high voltage scheme elements on the stability of a detector based on a single $10times10$ cm$^2$ area GEM with respect to the secondary discharge occurrence. These violent events pose a major threat to the integrity of GEM detectors and their Front-End Electronics and need to be avoided by any means. For a single GEM setup, we propose a detailed high voltage scheme that is designed to prevent secondary discharges. We determine optimal values of the protection resistors and parasitic capacitances introduced by cables used in the system. The results of this paper may be used as a guideline for the optimization of more complicated multi-GEM detectors.
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