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Fast high-fidelity entangling gates for spin qubits in Si double quantum dots

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 Publication date 2019
  fields Physics
and research's language is English




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Implementing high-fidelity two-qubit gates in single-electron spin qubits in silicon double quantum dots is still a major challenge. In this work, we employ analytical methods to design control pulses that generate high-fidelity entangling gates for quantum computers based on this platform. Using realistic parameters and initially assuming a noise-free environment, we present simple control pulses that generate CNOT, CPHASE, and CZ gates with average fidelities greater than 99.99% and gate times as short as 45 ns. Moreover, using the local invariants of the systems evolution operator, we show that a simple square pulse generates a CNOT gate in less than 27 ns and with a fidelity greater than 99.99%. Last, we use the same analytical methods to generate two-qubit gates locally equivalent to $sqrt{mathrm{CNOT}}$ and $sqrt{mathrm{CZ}}$ that are used to implement simple two-piece pulse sequences that produce high-fidelity CNOT and CZ gates in the presence of low-frequency noise.



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The flip-flop qubit, encoded in the states with antiparallel donor-bound electron and donor nuclear spins in silicon, showcases long coherence times, good controllability, and, in contrast to other donor-spin-based schemes, long-distance coupling. Electron spin control near the interface, however, is likely to shorten the relaxation time by many orders of magnitude, reducing the overall qubit quality factor. Here, we theoretically study the multilevel system that is formed by the interacting electron and nuclear spins and derive analytical effective two-level Hamiltonians with and without periodic driving. We then propose an optimal control scheme that produces fast and robust single-qubit gates in the presence of low-frequency noise and relatively weak magnetic fields without relying on parametrically restrictive sweet spots. This scheme increases considerably both the relaxation time and the qubit quality factor.
A two-qubit controlled-NOT (CNOT) gate, realized by a controlled-phase (C-phase) gate combined with single-qubit gates, has been experimentally implemented recently for quantum-dot spin qubits in isotopically enriched silicon, a promising solid-state system for practical quantum computation. In the experiments, the single-qubit gates have been demonstrated with fault-tolerant control-fidelity, but the infidelity of the two-qubit C-phase gate is, primarily due to the electrical noise, still higher than the required error threshold for fault-tolerant quantum computation (FTQC). Here, by taking the realistic system parameters and the experimental constraints on the control pulses into account, we construct experimentally realizable high-fidelity CNOT gates robust against electrical noise with the experimentally measured $1/f^{1.01}$ noise spectrum and also against the uncertainty in the interdot tunnel coupling amplitude. Our optimal CNOT gate has about two orders of magnitude improvement in gate infidelity over the ideal C-phase gate constructed without considering any noise effect. Furthermore, within the same control framework, high-fidelity and robust single-qubit gates can also be constructed, paving the way for large-scale FTQC.
Significant experimental advances in single-electron silicon spin qubits have opened the possibility of realizing long-range entangling gates mediated by microwave photons. Recently proposed iSWAP gates, however, require tuning qubit energies into resonance and have limited fidelity due to charge noise. We present a novel photon-mediated cross-resonance gate that is consistent with realistic experimental capabilities and requires no resonant tuning. Furthermore, we propose gate sequences capable of suppressing errors due to quasistatic noise for both the cross-resonance and iSWAP gates.
We demonstrate laser-driven two-qubit and single-qubit logic gates with fidelities 99.9(1)% and 99.9934(3)% respectively, significantly above the approximately 99% minimum threshold level required for fault-tolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a room-temperature trap. We study the speed/fidelity trade-off for the two-qubit gate, for gate times between 3.8$mu$s and 520$mu$s, and develop a theoretical error model which is consistent with the data and which allows us to identify the principal technical sources of infidelity.
We implement a technique for measuring the singlet-triplet energy splitting responsible for spin-to-charge conversion in semiconductor quantum dots. This method, which requires fast, single-shot charge measurement, reliably extracts an energy in the limits of both large and small splittings. We perform this technique on an undoped, accumulation-mode Si/SiGe triple-quantum dot and find that the measured splitting varies smoothly as a function of confinement gate biases. Not only does this demonstration prove the value of having an $in~situ$ excited-state measurement technique as part of a standard tune-up procedure, it also suggests that in typical Si/SiGe quantum dot devices, spin-blockade can be limited by lateral orbital excitation energy rather than valley splitting.
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