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Register a new userHanbury-Brown and Twiss exchange effects in a four-terminal tunnel junction
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We investigate the current-current correlations in a four-terminal Al-AlOx-Al tunnel junction where shot noise dominates. We demonstrate that cross-correlations in the presence of two biasing sources of the Hanbury-Brown and Twiss type are much stronger (approximately twice) than an incoherent sum of correlations generated by single sources. The difference is due to voltage fluctuations of the central island that give rise to current-current correlations in the four contacts of the junction. Our measurements are in close agreement with results obtained using a simple theoretical model based on the theory of shot noise in multi-terminal conductors, generalized here to arbitrary contacts.
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Quadratic detection in linear mesoscopic transport systems produces cross terms that can be viewed as interference signals reflecting statistical properties of charge carriers. In electronic systems these cross term interferences arise from exchange effects due to Pauli principle. Here we demonstrate fermionic Hanbury Brown and Twiss (HBT) exchange phenomena due to indistinguishability of charge carriers in a diffusive graphene system. These exchange effects are verified using current-current cross correlations in combination with regular shot noise (autocorrelation) experiments at microwave frequencies. Our results can be modeled using semiclassical analysis for a square-shaped metallic diffusive conductor, including contributions from contact transparency. The experimentally determined HBT exchange factor values lie between the calculated ones for coherent and hot electron transport.
We have investigated current-current correlations in a cross-shaped conductor made of graphene ribbons. We measured auto and cross correlations and compared them with the theoretical predictions for ideal diffusive conductors. Our data deviate from these predictions and agreement can be obtained only by adding contributions from occupation-number noise in the central region connecting the arms of the cross. Furthermore, we have determined Hanbury -- Brown and Twiss (HBT) exchange correlations in this system. Contrary to expectations for a cross-shaped diffusive system, we find finite HBT exchange effects due to the occupation-number noise at the crossing. The strength of these HBT exchange correlations is found to vary with gate voltage, and very a distinct HBT effect with large fluctuations is observed near the Dirac point.
We report measurements of Hanbury Brown and Twiss correlation of coherent light transmitted through disordered one-dimensional photonic lattices. Although such a lattice exhibits transverse Anderson localization when a single input site is excited, uniform excitation precludes its observation. By examining the Hanbury Brown--Twiss correlation for a uniformly excited disordered lattice, we observe intensity anticorrelations associated with photon antibunching--a signature of non-Gaussian statistics. Although the measured average intensity distribution is uniform, transverse Anderson localization nevertheless underlies the observed anticorrelation.
We present measurements of second- and higher-order intensity correlation functions (so-called Hanbury Brown and Twiss experiment) performed at the free-electron laser (FEL) FLASH in the non-linear regime of its operation. We demonstrate the high transverse coherence properties of the FEL beam with a degree of transverse coherence of about 80% and degeneracy parameter of the order 10^9 that makes it similar to laser sources. Intensity correlation measurements in spatial and frequency domain gave an estimate of the FEL average pulse duration of 50 fs. Our measurements of the higher-order correlation functions indicate that FEL radiation obeys Gaussian statistics, which is characteristic to chaotic sources.
We show that the essential physics of the Hanbury Brown-Twiss (HBT) and the thermal light ghost imaging experiments is the same, i.e., due to the intensity fluctuations of the thermal light. However, in the ghost imaging experiments, a large number of bits information needs to be treated together, whereas in the HBT there is only one bit information required to be obtained. In the HBT experiment far field is used for the purpose of easy detection, while in the ghost image experiment near (or not-far) field is used for good quality image.
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