We demonstrate a spin-based, all-dielectric electrometer based on an ensemble of nitrogen-vacancy (NV$^-$) defects in diamond. An applied electric field causes energy level shifts symmetrically away from the NV$^-$s degenerate triplet states via the Stark effect; this symmetry provides immunity to temperature fluctuations allowing for shot-noise-limited detection. Using an ensemble of NV$^-$s, we demonstrate shot-noise limited sensitivities approaching 1 V/cm/$sqrt{text{Hz}}$ under ambient conditions, at low frequencies ($<$10 Hz), and over a large dynamic range (20 dB). A theoretical model for the ensemble of NV$^-$s fits well with measurements of the ground-state electric susceptibility parameter, $langle k_perprangle$. Implications of spin-based, dielectric sensors for micron-scale electric-field sensing are discussed.
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