Subscribe to the gold package and get unlimited access to Shamra Academy
Register a new userSPEC application for achieving inelastic X-ray scattering experiment in the SSRF
136
0
0.0
(
0
)
Ask ChatGPT about the research
No Arabic abstract
In order to carry out inelastic X-ray scattering (IXS) experiment at BL15U1 beamline of Shanghai Synchrotron Radiation Facility (SSRF), the data acquisition and control system based on SPEC software has been developed. The IXS experimental method needs linkage control of monochromator, silicon drift detector (SDD) and ionization chamber on continuous segment-scan mode with variable step size, and gains the data of energy, spectrum and light intensity synchronously. A method is presented for achieving this function which was not realized only by using SSCAN of Experimental Physics and Industrial Control System (EPICS). This paper shows work details including control system description, SPEC configurations for EPICS devices, macro definitions and applications in the BL15U1. An IXS experiment was executed by using the SPEC control system, its results prove that the method is feasible to perform the experiment.
rate research
Read More
The GALAXIES beamline at the SOLEIL synchrotron is dedicated to inelastic x-ray scattering (IXS) and photoelectron spectroscopy (HAXPES) in the 2.3-12 keV hard x-ray range. These two techniques offer powerful, complementary methods of characterization of materials with bulk sensitivity, chemical and orbital selectivity, resonant enhancement and high resolving power. After a description of the beamline components and endstations, we address the beamline performances through a selection of recent works both in the solid and gas phases and using either IXS or HAXPES approaches. Prospects for studies on liquids are discussed.
We describe a setup for performing inelastic X-ray scattering measurements at the Matter in Extreme Conditions (MEC) endstation of the Linac Coherent Light Source (LCLS). This technique is capable of performing high-, meV-resolution measurements of dynamic ion features in both crystalline and non-crystalline materials. A four-bounce silicon (533) monochromator was used in conjunction with three silicon (533) diced crystal analyzers to provide an energy resolution of ~50 meV over a range of ~500 meV in single shot measurements. In addition to the instrument resolution function, we demonstrate the measurement of longitudinal acoustic phonon modes in polycrystalline diamond. Furthermore, this setup may be combined with the high intensity laser drivers available at MEC to create warm dense matter, and subsequently measure ion acoustic modes.
We describe the concepts and technical realization of the high-resolution soft-X-ray beamline ADRESS operating in the energy range from 300 to 1600 eV and intended for Resonant Inelastic X-ray Scattering (RIXS) and Angle-Resolved Photoelectron Spectroscopy (ARPES). The photon source is an undulator of novel fixed-gap design where longitudinal movement of permanent magnetic arrays controls not only the light polarization (including circular and 0-180 deg rotatable linear polarizations) but also the energy without changing the gap. The beamline optics is based on the well-established scheme of plane grating monochromator (PGM) operating in collimated light. The ultimate resolving power E/dE is above 33000 at 1 keV photon energy. The choice of blazed vs lamellar gratings and optimization of their profile parameters is described. Due to glancing angles on the mirrors as well as optimized groove densities and profiles of the gratings, high photon flux is achieved up to 1.0e13 photons/s/0.01%BW at 1 keV. Ellipsoidal refocusing optics used for the RIXS endstation demagnifies the vertical spot size down to 4 um, which allows slitless operation and thus maximal transmission of the high-resolution RIXS spectrometer delivering E/dE better than 11000 at 1 keV photon energy. Apart from the beamline optics, we give an overview of the control system, describe diagnostics and software tools, and discuss strategies used for the optical alignment. An introduction to the concepts and instrumental realization of the ARPES and RIXS endstations is given.
A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver full two-dimensional map of RIXS intensity in one shot with parallel detection in incoming hvin and outgoing hvout photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 in both hvin and hvout near a photon energy of 930 eV, with a vast potential for improvement. Combining such a spectrometer - nicknamed hv2 - with an XFEL source allows efficient time-resolved RIXS experiments.
A vacuum-compatible photon-counting hybrid pixel detector has been installed in the ultra-high vacuum (UHV) reflectometer of the four-crystal monochromator (FCM) beamline of the Physikalisch-Technische Bundesanstalt (PTB) at the electron storage ring BESSY II in Berlin, Germany. The setup is based on the PILATUS3 100K module. The detector can be used in the entire photon energy range accessible at the beamline from 1.75 to 10 keV. Complementing the already installed vacuum-compatible PILATUS 1M detector used for small-angle scattering (SAXS) and grazing incidence SAXS (GISAXS), it is possible to access larger scattering angles. The water-cooled module is located on the goniometer arm and can be positioned from -90{deg} to 90{deg} with respect to the incoming beam at a distance of about 200 mm from the sample. To perform absolute scattering experiments the linearity, homogeneity and the angular dependence of the quantum efficiency, including their relative uncertainties, have been investigated. In addition, first results of the performance in wide-angle X-ray scattering (WAXS), X-ray diffraction (XRD) and X-ray reflectometry (XRR) are presented.
Log in to be able to interact and post comments
comments
Fetching comments
Sign in to be able to follow your search criteria
