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Characterization and reduction of microfabrication-induced decoherence in superconducting quantum circuits

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 Added by Chris Quintana
 Publication date 2014
  fields Physics
and research's language is English




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Many superconducting qubits are highly sensitive to dielectric loss, making the fabrication of coherent quantum circuits challenging. To elucidate this issue, we characterize the interfaces and surfaces of superconducting coplanar waveguide resonators and study the associated microwave loss. We show that contamination induced by traditional qubit lift-off processing is particularly detrimental to quality factors without proper substrate cleaning, while roughness plays at most a small role. Aggressive surface treatment is shown to damage the crystalline substrate and degrade resonator quality. We also introduce methods to characterize and remove ultra-thin resist residue, providing a way to quantify and minimize remnant sources of loss on device surfaces.

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We find that stray infrared light from the 4 K stage in a cryostat can cause significant loss in superconducting resonators and qubits. For devices shielded in only a metal box, we measured resonators with quality factors Q = 10^5 and qubits with energy relaxation times T_1=120 ns, consistent with a stray light-induced quasiparticle density of 170-230 mu m^{-3}. By adding a second black shield at the sample temperature, we found about an order of magnitude improvement in performance and no sensitivity to the 4 K radiation. We also tested various shielding methods, implying a lower limit of Q = 10^8 due to stray light in the light-tight configuration.
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