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Analytical Alignment Tolerances for Off-Plane Reflection Grating Spectroscopy

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 Added by Ryan Allured
 Publication date 2013
  fields Physics
and research's language is English




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Future NASA X-ray Observatories will shed light on a variety of high-energy astrophysical phenomena. Off-plane reflection gratings can be used to provide high throughput and spectral resolution in the 0.3--1.5 keV band, allowing for unprecedented diagnostics of energetic astrophysical processes. A grating spectrometer consists of multiple aligned gratings intersecting the converging beam of a Wolter-I telescope. Each grating will be aligned such that the diffracted spectra overlap at the focal plane. Misalignments will degrade both spectral resolution and effective area. In this paper we present an analytical formulation of alignment tolerances that define grating orientations in all six degrees of freedom. We verify our analytical results with raytrace simulations to fully explore the alignment parameter space. We also investigate the effect of misalignments on diffraction efficiency.



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An X-ray spectrograph consisting of radially ruled off-plane reflection gratings and silicon pore optics was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic (SPO) stack used is a test module for the Arcus small explorer mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with a SPO to produce an overlapped spectrum. The gratings were aligned using an active alignment module which allows for the independent manipulation of subsequent gratings to a reference grating in three degrees of freedom using picomotor actuators which are controllable external to the test chamber. We report the line spread functions of the spectrograph and the actively aligned gratings, and plans for future development.
Future NASA X-ray spectroscopy missions will require high throughput, high resolution grating spectrometers. Off-plane reflection gratings are capable of meeting the performance requirements needed to realize the scientific goals of these missions. We have identified a novel grating fabrication method that utilizes common lithographic and microfabrication techniques to produce the high fidelity groove profile necessary to achieve this performance. Application of this process has produced an initial pre-master that exhibits a radial (variable line spacing along the groove dimension), high density (>6000 grooves/mm), laminar profile. This pre-master has been tested for diffraction efficiency at the BESSY II synchrotron light facility and diffracts up to 55% of incident light into usable spectral orders. Furthermore, tests of spectral resolving power show that these gratings are capable of obtaining resolutions well above 1300 ($lambda/Deltalambda$) with limitations due to the test apparatus, not the gratings. Obtaining these results has provided confidence that this fabrication process is capable of producing off-plane reflection gratings for the next generation of X-ray observatories.
The Cherenkov Telescope Array (CTA) is a forthcoming international ground-based observatory for very high-energy gamma rays. Its goal is to reach sensitivity five to ten times better than existing Cherenkov telescopes such as VERITAS, H.E.S.S. or MAGIC and extend the range of observation to energies down to few tens of GeV and beyond 100 TeV. To achieve this goal, an array of about 100 telescopes is required, meaning a total reflective surface of several thousands of square meters. Thence, the optimal technology used for CTA mirrors manufacture should be both low-cost (~1000 euros/m2) and allow high optical performances over the 300-550 nm wavelength range. More exactly, a reflectivity higher than 85% and a PSF (Point Spread Function) diameter smaller than 1 mrad. Surface roughness can significantly contribute to PSF broadening and limit telescope performances. Fortunately, manufacturing techniques for mirrors are now available to keep the optical scattering well below the geometrically-predictable effect of figure errors. This paper determines first order surface finish tolerances based on a surface microroughness characterization campaign, using Phase Shift Interferometry. That allows us to compute the roughness contribution to Cherenkov telescope PSF. This study is performed for diverse mirror candidates (MAGIC-I and II, ASTRI, MST) varying in manufacture technologies, selected coating materials and taking into account the degradation over time due to environmental hazards.
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