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Register a new userAvoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced DC-magnetic field sensitivity
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We report a systematic study of the magnetic field sensitivity of a magnetic sensor based on a single Nitrogen-Vacancy (NV) defect in diamond, by using continuous optically detected electron spin resonance (ESR) spectroscopy. We first investigate the behavior of the ESR contrast and linewidth as a function of the microwave and optical pumping power. The experimental results are in good agreement with a simplified model of the NV defect spin dynamics, yielding to an optimized sensitivity around 2 mu T/sqrt{rm Hz}. We then demonstrate an enhancement of the magnetic sensitivity by one order of magnitude by using a simple pulsed-ESR scheme. This technique is based on repetitive excitation of the NV defect with a resonant microwave pi-pulse followed by an optimized read-out laser pulse, allowing to fully eliminate power broadening of the ESR linewidth. The achieved sensitivity is similar to the one obtained by using Ramsey-type sequences, which is the optimal magnetic field sensitivity for the detection of DC magnetic fields.
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Magnetometry and magnetic imaging with nitrogen-vacancy (NV) defects in diamond rely on the optical detection of electron spin resonance (ESR). However, this technique is inherently limited to magnetic fields that are weak enough to avoid electron spin mixing. Here we focus on the high off-axis magnetic field regime for which spin mixing alters the NV defect spin dynamics. We first study in a quantitative manner the dependence of the NV defect optical properties on the magnetic field vector B. Magnetic-field-dependent time-resolved photoluminescence (PL) measurements are compared to a seven-level model of the NV defect that accounts for field-induced spin mixing. The model reproduces the decreases in (i) ESR contrast, (ii) PL intensity and (iii) excited level lifetime with an increasing off-axis magnetic field. We next demonstrate that those effects can be used to perform all-optical magnetic imaging in the high off-axis magnetic field regime. Using a scanning NV defect microscope, we map the stray field of a magnetic hard disk through both PL and fluorescence lifetime imaging. This all-optical method for high magnetic field imaging at the nanoscale might be of interest in the field of nanomagnetism, where samples producing fields in excess of several tens of milliteslas are typical.
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