Numerical study of soft x-ray yield in two dense plasma focus devices based on Lee code, and comparing it with experimental results using neon filling gas
published by Aِl-Baath University
in 2017
in
and research's language is
العربية
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Abstract in English
In this work we carried out some numerical experiments on NX2,
UNU/ICTP PFF dense plasma focus device with neon filling gas using Lee
code version (RADPFV5.15de.c1) and standard parameters of the devices
to compare the value of the soft x-ray yield (Ysxr) emitting from each one.
Also we studied the influence some factors on the value of (Ysxr).
References used
LEE.S et al, 2010- A Course On Plasma Focus Numerical Experiments, ICTP-IAEA Workshop on Dense Magnetized Plasmas and Plasma Diagnostics . Italy,Trieste,300p
LEE.S et al,1998- "sxr lithography using a high performance plasma focus source". ICPP & 25th EPS Conference on Controlled
RAWAT.R et al, 2005-"Soft X-ray Imaging using a Neon Filled Plasma Focus X-ray, Source Journal of Fusion Energy". vol. 23, No. 1.DOI: 10.1007/s10894-004-1871-5