Design of integrated current sensor BICS for IDDQ Test in CMOS circuits
published by Aِl-Baath University
in 2017
in Informatics Engineering
and research's language is
العربية
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Abstract in English
IDDQ testing techniques are used to detect the physical defects
such gate oxide shorts,floating gates and bridging faults, and which
happen for the presence of manufacturing faults during the
manufacturing processes of CMOS integrated circuits, which
cannot be detected by classical logical testing.
References used
BRKAR S., 1999- Design challenges of technology scaling. IEEE Micro 19 (4) p 23–29
JHA N. K. and GUPTA S., 2003 - Testing of Digital Systems. Cambridge University Press
MICZO A., 2003- Digital Logic Testing and Simulation. Second Edition John Wiley & Sons