CdTe Thin films were deposited on glass substrates by thermal evaporation method. The geometric thickness was calculated using interferometric method based on reflectance curve recorded with the spectrophotometer. The XRD analysis and optical characterizations of CdTe films with different optical thicknesses reveals that the structure of the films is polycrystalline with preferential orientation (111). The structure constant (a), crystallite size (D), dislocation density (δ) and strain (ε) were calculated, and it is observed that the crystallite size increases but micro-strain and dislocation density decreases with increases in thin film thickness. The overall absorbance has been increased with the film thickness and the direct band gap was obtained. It decreases with the increase in the thickness of the films.