Height and Feature Parameters Study of thermally evaporated ZnS thin films By AFM
published by Damascus University
in 2013
in Physics
and research's language is
العربية
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Abstract in English
AFM has been used to get microscopic information of the surface structure
and to plot topographies representing the surface relief. AFM technique can be
used to visualize the surface relief, specify the growth of thin films, and
determine Height parameters.
References used
Gao X. D., Li X. M, Yu W. D., Studies of zinc and lead chalcogenide thin films grown by SILAR Thin Solid films 468 (2004)43
Cheng J., Fan D., Wang H., Liu B. W., Chemical bath deposition of crystalline ZnS thin films, Semicond. Sci. Technol. 18 (2003)676
S. H. Deulkar, C. H. Bhosaile, M. Sharon, A study of structural, compositional and optical properties of spray-deposited non-stoichiometric (Zn,Fe)S thin films, J. Phys. Chem. Solids 65(2004)1879