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Register a new userPhotoemission Electron Microscopy as a tool for the investigation of optical near fields
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M. Cinchetti
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Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg UV-lamp (photon energy cutoff $hbaromega_{UV}=5.0$ eV, wavelength $lambda_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser ($hbaromega_{l}=3.1$ eV, $lambda_{l}=400$ nm, pulse width below 200 fs), respectively. While homogeneous photoelectron emission from the metal is observed upon illumination at energies above the silver plasmon frequency, at lower photon energies the emission is localized at tips of the structure. This is interpreted as a signature of the local electrical field therefore providing a tool to map the optical near field with the resolution of emission electron microscopy.
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Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artefacts. Here, Optical Near-field Electron Microscopy (ONEM) is proposed, an imaging technique that combines non-invasive probing with light, with a high spatial resolution read-out via electron optics. Close to the specimen, the optical near-fields are converted into a spatially varying electron flux using a planar photocathode. The electron flux is imaged using low energy electron microscopy, enabling label-free nanometric resolution without the need to scan a probe across the sample. The specimen is never exposed to damaging electrons.
We present a new method of measuring optical near-fields within ~1 nm of a metal surface, based on rescattering of photoemitted electrons. With this method, we precisely measure the field enhancement factor for tungsten and gold nanotips as a function of tip radius. The agreement with Maxwell simulations is very good. Further simulations yield a field enhancement map for all materials, which shows that optical near-fields at nanotips are governed by a geometric effect under most conditions, while plasmon resonances play only a minor role. Last, we consider the implications of our results on quantum mechanical effects near the surface of nanostructures and discuss features of quantum plasmonics.
We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution achievable by this technique are demonstrated.
We present the experimental implementation of simultaneous spatial multimode demultiplexing as a distance measurement tool. We first show a simple and intuitive derivation of the Fisher information in the presence of Poissonian noise. We then estimate the distance between two incoherent beams in both directions of the transverse plane, and find a perfect accordance with theoretical prediction, given a proper calibration of the demultiplexer. We find that, even though sensitivity is limited by the cross-talks between channels, we can perform measurements in 2 dimensions much beyond Rayleigh limit with a large dynamic.
We introduce a point-like scanning single-photon source that operates at room temperature and offers an exceptional photostability (no blinking, no bleaching). This is obtained by grafting in a controlled way a diamond nanocrystal (size around 20 nm) with single nitrogen-vacancy color-center occupancy at the apex of an optical probe. As an application, we image metallic nanostructures in the near-field, thereby achieving a near-field scanning single-photon microscopy working at room temperature on the long term. Our work may be of importance to various emerging fields of nanoscience where an accurate positioning of a quantum emitter is required such as for example quantum plasmonics.
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