No Arabic abstract
Numerical and analytic results for the exponent theta describing the decay of the first return probability of an interface to its initial height are obtained for a large class of linear Langevin equations. The models are parametrized by the dynamic roughness exponent beta, with 0 < beta < 1; for beta = 1/2 the time evolution is Markovian. Using simulations of solid-on-solid models, of the discretized continuum equations as well as of the associated zero-dimensional stationary Gaussian process, we address two problems: The return of an initially flat interface, and the return to an initial state with fully developed steady state roughness. The two problems are shown to be governed by different exponents. For the steady state case we point out the equivalence to fractional Brownian motion, which has a return exponent theta_S = 1 - beta. The exponent theta_0 for the flat initial condition appears to be nontrivial. We prove that theta_0 to infty for beta to 0, theta_0 geq theta_S for beta < 1/2 and theta_0 leq theta_S for beta > 1/2, and calculate theta_{0,S} perturbatively to first order in an expansion around the Markovian case beta = 1/2. Using the exact result theta_S = 1 - beta, accurate upper and lower bounds on theta_0 can be derived which show, in particular, that theta_0 geq (1 - beta)^2/beta for small beta.
We report the results of numerical investigations of the steady-state (SS) and finite-initial-conditions (FIC) spatial persistence and survival probabilities for (1+1)--dimensional interfaces with dynamics governed by the nonlinear Kardar--Parisi--Zhang (KPZ) equation and the linear Edwards--Wilkinson (EW) equation with both white (uncorrelated) and colored (spatially correlated) noise. We study the effects of a finite sampling distance on the measured spatial persistence probability and show that both SS and FIC persistence probabilities exhibit simple scaling behavior as a function of the system size and the sampling distance. Analytical expressions for the exponents associated with the power-law decay of SS and FIC spatial persistence probabilities of the EW equation with power-law correlated noise are established and numerically verified.
The persistence behavior for fluctuating steps on the $Si(111)$ $(sqrt3 times sqrt3)R30^{0} - Al$ surface was determined by analyzing time-dependent STM images for temperatures between 770 and 970K. The measured persistence probability follows a power law decay with an exponent of $theta=0.77 pm 0.03$. This is consistent with the value of $theta= 3/4$ predicted for attachment/detachment limited step kinetics. If the persistence analysis is carried out in terms of return to a fixed reference position, the measured persistence probability decays exponentially. Numerical studies of the Langevin equation used to model step motion corroborate the experimental observations.
We show experimentally and theoretically that the persistence of large deviations in equilibrium step fluctuations is characterized by an infinite family of independent exponents. These exponents are obtained by carefully analyzing dynamical experimental images of Al/Si(111) and Ag(111) equilibrium steps fluctuating at high (970K) and low (320K) temperatures respectively, and by quantitatively interpreting our observations on the basis of the corresponding coarse-grained discrete and continuum theoretical models for thermal surface step fluctuations under attachment/detachment (``high-temperature) and edge-diffusion limited kinetics (``low-temperature) respectively.
We report numerical and analytic results for the spatial survival probability for fluctuating one-dimensional interfaces with Edwards-Wilkinson or Kardar-Parisi-Zhang dynamics in the steady state. Our numerical results are obtained from analysis of steady-state profiles generated by integrating a spatially discretized form of the Edwards-Wilkinson equation to long times. We show that the survival probability exhibits scaling behavior in its dependence on the system size and the `sampling interval used in the measurement for both `steady-state and `finite initial conditions. Analytic results for the scaling functions are obtained from a path-integral treatment of a formulation of the problem in terms of one-dimensional Brownian motion. A `deterministic approximation is used to obtain closed-form expressions for survival probabilities from the formally exact analytic treatment. The resulting approximate analytic results provide a fairly good description of the numerical data.
We present a detailed study of squared local roughness (SLRDs) and local extremal height distributions (LEHDs), calculated in windows of lateral size $l$, for interfaces in several universality classes, in substrate dimensions $d_s = 1$ and $d_s = 2$. We show that their cumulants follow a Family-Vicsek type scaling, and, at early times, when $xi ll l$ ($xi$ is the correlation length), the rescaled SLRDs are given by log-normal distributions, with their $n$th cumulant scaling as $(xi/l)^{(n-1)d_s}$. This give rise to an interesting temporal scaling for such cumulants $leftlangle w_n rightrangle_c sim t^{gamma_n}$, with $gamma_n = 2 n beta + {(n-1)d_s}/{z} = left[ 2 n + {(n-1)d_s}/{alpha} right] beta$. This scaling is analytically proved for the Edwards-Wilkinson (EW) and Random Deposition interfaces, and numerically confirmed for other classes. In general, it is featured by small corrections and, thus, it yields exponents $gamma_n$s (and, consequently, $alpha$, $beta$ and $z$) in nice agreement with their respective universality class. Thus, it is an useful framework for numerical and experimental investigations, where it is, usually, hard to estimate the dynamic $z$ and mainly the (global) roughness $alpha$ exponents. The stationary (for $xi gg l$) SLRDs and LEHDs of Kardar-Parisi-Zhang (KPZ) class are also investigated and, for some models, strong finite-size corrections are found. However, we demonstrate that good evidences of their universality can be obtained through successive extrapolations of their cumulant ratios for long times and large $l$s. We also show that SLRDs and LEHDs are the same for flat and curved KPZ interfaces.