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Register a new userDiffraction Anomalous Fine Structure spectroscopy at the beamline BM2 at the European Synchrotron Radiation Facility
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Diffraction Anomalous Fine Structure (DAFS) spectroscopy uses resonant elastic x-rays scattering as an atomic, shell and site selective probe that gives information on the electronic structure and the local atomic environment as well as on the long range ordered crystallographic structure. A DAFS experiment consists of measuring the Bragg peak intensities as a function of the energy of the incoming x-ray beam. The French CRG (Collaborative Research Group) beamline BM2-D2AM (Diffraction Diffusion Anomale Multi-longueurs donde) at the ESRF (European Synchrotron Radiation Facility) has developed a state of the art energy scan diffraction set-up. In this article, we present the requirements for obtaining reliable DAFS data and report recent technical achievements.
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The measurement of the Compton edge of the scattered electrons in GRAAL facility in European Synchrotron Radiation Facility (ESRF) in Grenoble with respect to the Cosmic Microwave Background dipole reveals up to 10 sigma variations larger than the statistical errors. We now show that the variations are not due to the frequency variations of the accelerator. The nature of Compton edge variations remains unclear, thus outlining the imperative of dedicated studies of light speed anisotropy.
The photoelectron spectroscopy beamline at National Synchrotron Radiation Laboratory (NSRL) is equipped with a spherical grating monochromator with the included angle of 174 deg. Three gratings with line density of 200, 700 and 1200 lines/mm are used to cover the energy region from 60 eV to 1000 eV. After several years operation, the spectral resolution and flux throughput were deteriorated, realignment is necessary to improve the performance. First, the wavelength scanning mechanism, the optical components position and the exit slit guide direction are aligned according to the design value. Second, the gratings are checked by Atomic Force Microscopy (AFM). And then the gas absorption spectrum is measured to optimize the focusing condition of the monochromator. The spectral resolving power is recovered to the designed value of 1000@244eV. The flux at the end station for the 200 lines/mm grating is about 10^10 photons/sec/200mA, which is in accordance with the design. The photon flux for the 700 lines/mm grating is about 5 X 10^8 photons/sec/200mA, which is lower than expected. This poor flux throughput may be caused by carbon contamination on the optical components. The 1200 lines/mm grating has roughness much higher than expected so the diffraction efficiency is too low to detect any signal. A new grating would be ordered. After the alignment, the beamline has significant performance improvements in both the resolving power and the flux throughput for 200 and 700 lines/mm gratings and is provided to users.
Fine structure analysis of core electron excitation spectra is a cornerstone characterization technique across the physical sciences. Spectra are most commonly measured with synchrotron radiation and X-ray spot sizes on the {mu}m to mm scale. Alternatively, electron energy loss spectroscopy (EELS) in the (scanning) transmission electron microscope ((S)TEM) offers over a 1000 fold increase in spatial resolution, a transformative advantage for studies of nanostructured materials. However, EELS applicability is generally limited to excitations below ~2 keV, i.e., mostly to elements in just the first three rows of the periodic table. Here, using state-of-the-art EELS instrumentation, we present nm resolved fine structure EELS measurements out to an unprecedented 12 keV with signal-to-noise ratio rivaling that of a synchrotron. We showcase the advantages of this technique in exemplary experiments.
The GALAXIES beamline at the SOLEIL synchrotron is dedicated to inelastic x-ray scattering (IXS) and photoelectron spectroscopy (HAXPES) in the 2.3-12 keV hard x-ray range. These two techniques offer powerful, complementary methods of characterization of materials with bulk sensitivity, chemical and orbital selectivity, resonant enhancement and high resolving power. After a description of the beamline components and endstations, we address the beamline performances through a selection of recent works both in the solid and gas phases and using either IXS or HAXPES approaches. Prospects for studies on liquids are discussed.
A triple-GEM detector with two-dimensional readout is developed. The detector provides high position resolution for powder diffraction experiments at synchrotron radiation. Spatial resolution of the detector is measured in the lab using a 55Fe X-ray source. A resolution of about 110 um FWHM is achieved. The energy resolution is better than 27% for 5.9 keV X-rays. The detectors validity under illumination of photons in particular energy range is verified using a Cu X-ray tube. Imaging of the head of a wire stripper with X-ray tube demonstrates its imaging ability. A diffraction imaging experiment using the sample of powder SiO2 is successfully carried out at 1W2B laboratory of Beijing Synchrotron Radiation Facility (BSRF). Different diffraction rings are clearly seen under various X-ray energies.
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