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Concordance: In-flight Calibration of X-ray Telescopes without Absolute References

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 Added by Herman L. Marshall
 Publication date 2021
  fields Physics
and research's language is English




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We describe a process for cross-calibrating the effective areas of X-ray telescopes that observe common targets. The targets are not assumed to be standard candles in the classic sense, in that we assume that the source fluxes have well-defined, but {it a priori} unknown values. Using a technique developed by Chen et al. (2019, arXiv:1711.09429) that involves a statistical method called {em shrinkage estimation}, we determine effective area correction factors for each instrument that brings estimated fluxes into the best agreement, consistent with prior knowledge of their effective areas. We expand the technique to allow unique priors on systematic uncertainties in effective areas for each X-ray astronomy instrument and to allow correlations between effective areas in different energy bands. We demonstrate the method with several data sets from various X-ray telescopes.



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We present the calibration of the Insight-Hard X-ray Modulation Telescope (Insight-HXMT) X-ray satellite, which can be used to perform timing and spectral studies of bright X-ray sources. Insight-HXMT carries three main payloads onboard: the High Energy X-ray telescope (HE), the Medium Energy X-ray telescope (ME) and the Low Energy X-ray telescope (LE). In orbit, the radioactive sources, activated lines, the fluorescence lines and celestial sources are used to calibrate the energy scale and energy resolution of the payloads. The Crab nebular is adopted as the primary effective area calibrator and empirical functions are constructed to modify the simulated effective areas of the three payloads respectively. The systematic errors of HE, compared to the model of the Crab nebular, are less than 2% in 28--120 keV and 2%--10% above 120 keV. The systematic errors of ME are less than 1.5% in 10--35 keV. The systematic errors of LE are less than 1% in 1--7 keV except the Si K--edge (1.839 keV, up to 1.5%) and less than 2% in 7--10 keV.
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