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Register a new userInfluence of Contacts and Applied Voltage on a Structure of a Single GaN Nanowire
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Semiconductor nanowires (NWs) have a broad range of applications for nano- and optoelectronics. The strain field of gallium nitride (GaN) NWs could be significantly changed when contacts are applied to them to form a final device, especially considering the piezoelectric properties of GaN. Investigation of influence of the metallic contacts on the structure of the NWs is of high importance for their applications in real devices. We have studied a series of different type of contacts and influence of the applied voltage bias on the contacted GaN NWs with the length of about 3 to 4 micrometers and with two different diameters of 200 nm and 350 nm. It was demonstrated that the NWs with the diameter of 200 nm are bend already by the interaction with the substrate. For all GaN NWs, significant structural changes were revealed after the contacts deposition. The results of our research may contribute to the future optoelectronic applications of the GaN nanowires.
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We present the combined analysis of the electroluminescence (EL) as well as the current-voltage (I-V) behavior of single, freestanding (In,Ga)N/GaN nanowire (NW) light-emitting diodes (LEDs) in an unprocessed, self-assembled ensemble grown by molecular beam epitaxy. The data were acquired in a scanning electron microscope equipped with a micromanipulator and a luminescence detection system. Single NW spectra consist of emission lines originating from different quantum wells, and the width of the spectra increases with decreasing peak emission energy. The corresponding I-V characteristics are described well by the modified Shockley equation. The key advantage of this measurement approach is the possibility to correlate the EL intensity of a single NW LED with the actual current density in this NW. This way, the external quantum efficiency (EQE) can be investigated as a function of the current in a single NW LED. The comparison of the EQE characteristic of single NWs and the ensemble device allows a quite accurate determination of the actual number of emitting NWs in the working ensemble LED and the respective current densities in its individual NWs. This information is decisive for a meaningful and comprehensive characterization of a NW ensemble device, rendering the measurement approach employed here a very powerful analysis tool.
We have studied spectral diffusion of the photoluminescence of a single CdSe quantum dot inserted in a ZnSe nanowire. We have measured the characteristic diffusion time as a function of pumping power and temperature using a recently developed technique [G. Sallen et al, Nature Photon. textbf{4}, 696 (2010)] that offers subnanosecond resolution. These data are consistent with a model where only a emph{single} carrier wanders around in traps located in the vicinity of the quantum dot.
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Current voltage and Kelvin Probe Force Microscopy (KPFM) measurements were performed on single ZnO nanowires. Measurements are shown to be strongly correlated with the contact behavior, either ohmic or Schottky. The ZnO nanowires were obtained by metallo-organic chemical vapor deposition (MOCVD) and contacted using electronic-beam lithography. Depending on the contact geometry, good quality ohmic contacts (linear I V behavior) or non-linear (diode like) Schottky contacts were obtained. Current voltage and KPFM measurements on both types of contacted ZnO nanowires were performed in order to investigate their behavior. A clear correlation could be established between the I V curve, the electrical potential profile along the device and the nanowire geometry. Some arguments supporting this behavior are given based on a depleted region extension. This work will help to better understand the electrical behavior of ohmic contacts on single ZnO nanowires, for future applications in nanoscale field effect-transistors and nano-photodetectors.
Harmonic Hall voltage measurements are a wide-spread quantitative technique for the measurement of spin-orbit induced effective fields in heavy-metal / ferromagnet heterostructures. In the vicinity of the voltage pickup lines in the Hall bar, the current is inhomogeneous, which leads to a hitherto not quantified reduction of the effective fields and derived quantities, such as the spin Hall angle or the spin Hall conductivity. Here we present a thorough analysis of the influence of the aspect ratio of the voltage pickup lines to current channel widths on the apparent spin Hall angle. Experiments were performed with Hall bars with a broad range of aspect ratios and a substantial reduction of the apparent spin Hall angle is already seen in Hall crosses with an aspect ratio of 1:1. Our experimental results are confirmed by finite-element simulations of the current flow.
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