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Analog pile-up circuit technique using a single capacitor for the readout of Skipper-CCD detectors

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 Added by Miguel Sofo Haro
 Publication date 2021
  fields Physics
and research's language is English




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With Skipper-CCD detectors it is possible to take multiple samples of the charge packet collected on each pixel. After averaging the samples, the noise can be extremely reduced allowing the exact counting of electrons per pixel. In this work we present an analog circuit that, with a minimum number of components, applies a double slope integration (DSI), and at the same time, it averages the multiple samples producing at its output the pixel value with sub-electron noise. For this prupose, we introduce the technique of using the DSI integrator capacitor to add the skipper samples. An experimental verification using discrete components is presented, together with an analysis of its noise sources and limitations. After averaging 400 samples it was possible reach a readout noise of 0.2,$e^-_{RMS}/pix$, comparable to other available readout systems. Due to its simplicity and significant reduction of the sampling requirements, this circuit technique is of particular interest in particle experiments and cameras with a high density of Skipper-CCDs.



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We use a science-grade Skipper Charge Coupled Device (Skipper-CCD) operating in a low-radiation background environment to develop a semi-empirical model that characterizes the origin of single-electron events in CCDs. We identify, separate, and quantify three independent contributions to the single-electron events, which were previously bundled together and classified as ``dark counts: dark current, amplifier light, and spurious charge. We measure a dark current, which depends on exposure, of (5.89+-0.77)x10^-4 e-/pix/day, and an unprecedentedly low spurious charge contribution of (1.52+-0.07)x10^-4 e-/pix, which is exposure-independent. In addition, we provide a technique to study events produced by light emitted from the amplifier, which allows the detectors operation to be optimized to minimize this effect to a level below the dark-current contribution. Our accurate characterization of the single-electron events allows one to greatly extend the sensitivity of experiments searching for dark matter or coherent neutrino scattering. Moreover, an accurate understanding of the origin of single-electron events is critical to further progress in ongoing R&D efforts of Skipper and conventional CCDs.
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The skipper CCD is a special type of charge coupled device in which the readout noise can be reduced to sub-electron levels by averaging independent measurements of the same charge. Thus the charge in the pixels can be determined by counting the exact number of electrons. The total readout time is proportional to the number of measurements of the charge in each pixel. For some applications this time may be too long; however, researchers usually are interested only on certain region within the matrix of pixels. In this paper we present the development of a smart skipper readout technique that allows the user to specify regions of interest of the CCD matrix where an arbitrary (high) number of measurements of the same charge can taken to obtain the desired noise level, and far less measurements are performed in those regions that are less interesting to the researcher, therefore reducing the total readout time.
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