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Register a new userRadiation Hardness Study of the ePix100 Sensor and ASIC under Direct Illumination at the European XFEL
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Authors
I. Klav{c}kova
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The ePix detector family provides multiple variants of hybrid pixel detectors to support a wide range of applications at free electron laser facilities. We present the results of a systematic study of the influence of radiation induced damage on the performance and lifetime of an ePix100a detector module using a direct attenuated beam of the EuXFEL at 9 keV photon energy and an average power of 10 $mu$W. An area of 20 x 20 pixels was irradiated with an average photon flux of approx. 7 x $10^{9}$ photons/s to a dose of approximately 760$pm$65 kGy at the location of the Si/SiO$_2$ interfaces in the sensor. A dose dependent increase in both offset and noise of the ePix100a detector have been observed originating from an increase of the sensor leakage current. Moreover, we observed an effect directly after irradiation resulting in the saturation of individual pixels by their dark current. Changes in gain are evaluated one and half hours post irradiation and suggest damage to occur also on the ASIC level. Based on the obtained results, thresholds for beam parameters are deduced and the detector lifetime is estimated with respect to the requirements to the data quality in order to satisfy the scientific standards defined by the experiments. We conclude the detector can withstand a beam with an energy up to 1 $mu$J at a photon energy of 9 keV impacting on an area of 1 mm$^2$. The detector can be used without significant degradation of its performance for several years if the incident photon beam intensities do not exceed the detectors dynamic range by at least three orders of magnitude. Our results provide valuable input for the operation of the ePix100a detector at FEL facilities and for the design of future detector technology.
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The emergence of high repetition-rate X-ray free-electron lasers (XFELs) powered by superconducting accelerator technology enables the measurement of significantly more experimental data per day than was previously possible. The European XFEL will soon provide 27,000 pulses per second, more than two orders of magnitude more than any other XFEL. The increased pulse rate is a key enabling factor for single-particle X-ray diffractive imaging, which relies on averaging the weak diffraction signal from single biological particles. Taking full advantage of this new capability requires that all experimental steps, from sample preparation and delivery to the acquisition of diffraction patterns, are compatible with the increased pulse repetition rate. Here, we show that single-particle imaging can be performed using X-ray pulses at megahertz repetition rates. The obtained results pave the way towards exploiting high repetition-rate X-ray free-electron lasers for single-particle imaging at their full repetition rate.
The Adaptive Gain Integrating Pixel Detector (AGIPD) is an x-ray imager, custom designed for the European x-ray Free-Electron Laser (XFEL). It is a fast, low noise integrating detector, with an adaptive gain amplifier per pixel. This has an equivalent noise of less than 1 keV when detecting single photons and, when switched into another gain state, a dynamic range of more than 10$^4$ photons of 12 keV. In burst mode the system is able to store 352 images while running at up to 6.5 MHz, which is compatible with the 4.5 MHz frame rate at the European XFEL. The AGIPD system was installed and commissioned in August 2017, and successfully used for the first experiments at the Single Particles, Clusters and Biomolecules (SPB) experimental station at the European XFEL since September 2017. This paper describes the principal components and performance parameters of the system.
The European X-ray Free Electron Laser (XFEL.EU) will provide unprecedented peak brilliance and ultra-short and spatially coherent X-ray pulses in an energy range of 0.25 to 25 keV . The pulse timing structure is unique with a burst of 2700 pulses of 100 fs length at a temporal distance of 220 ns followed by a 99.4 ms gap. To make optimal use of this timing structure and energy range a great variety of detectors are being developed for use at XFEL.EU, including 2D X-ray imaging cameras that are able to detect images at a rate of 4.5 MHz, provide dynamic ranges up to 10$^5$ photons per pulse per pixel under different operating conditions and covering a large range of angular resolution. In order to characterize, commission and calibrate this variety of detectors and for testing of detector prototypes the XFEL.EU detector group is building up an X-ray test laboratory that allows testing of detectors with X-ray photons under conditions that are as similar to the future beam line conditions at the XFEL.EU as is possible with laboratory sources. A total of four test environments provide the infrastructure for detector tests and calibration: two portable setups that utilize low power X-ray sources and radioactive isotopes, a test environment where a commercial high power X-ray generator is in use, and a pulsed X-ray/electron source which will provide pulses as short as 25 ns in XFEL.EU burst mode combined with target anodes of different materials. The status of the test environments, three of which are already in use while one is in commissioning phase, will be presented as well as first results from performance tests and characterization of the sources.
The European X-ray Free Electron Laser (XFEL.EU) will provide as-yet-unrivaled peak brilliance and ultra-short pulses of spatially coherent X-rays with a pulse length of less than 100 fs in the energy range between 0.25 and 25 keV. The high radiation intensity and ultra-short pulse duration will open a window for novel scientific techniques and will allow to explore new phenomena in biology, chemistry, material science, as well as matter at high energy density, atomic, ion and molecular physics. The variety of scientific applications and especially the unique XFEL.EU time structure require adequate instrumentation to be developed in order to exploit the full potential of the light source. To make optimal use of the unprecedented capabilities of the European XFEL and master these vast technological challenges, the European XFEL GmbH has started a detector R&D program. The technology concepts of the detector system presently under development are complementary in their performance and will cover the requirements of a large fraction of the scientific applications envisaged for the XFEL.EU facility. The actual status of the detector development projects which includes ultra-fast 2D imaging detectors, low repetition rate 2D detectors as well as strip detectors for e.g. spectroscopy applications and the infrastructure for the detectors calibration and tests will be presented. Furthermore, an overview of the forthcoming implementation phase of the European XFEL in terms of detector R&D will be given.
The European X-ray Free Electron Laser (XFEL.EU) is currently being commissioned in Schenefeld, Germany. From 2017 onwards it will provide spatially coherent X-rays of energies between 0.25,keV and 25,keV with a unique timing structure. One of the detectors foreseen at XFEL.EU for the soft X-ray regime (energies below 6,keV) is a quasi column-parallel readout FastCCD developed by Lawrence Berkeley National Lab (LBNL) specifically for the XFEL.EU requirements. Its sensor has 1920$times$960 pixels of 30,$mu$m $times$30,$mu$m size with a beam hole in the middle of the sensor. The camera can be operated in full frame and frame store mode. With the FastCCD a frame rate of up to 120~fps can be achieved, but at XFEL.EU the camera settings are optimized for the 10,Hz XFEL bunch-mode. The detector has been delivered to XFEL.EU. Results of the performance tests and calibration done using the XFEL.EU detector calibration infrastructure are presented quantifying noise level, gain and energy resolution.
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