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Register a new userUnique Reconstruction of the Heat-Reflection Indices at Solid Interfaces
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We show the unique reconstruction of the heat-reflection coefficients in a phonon transport equation. This is a mathematical model used to characterize the dynamics of heat-conducting phonons in multiple layers of media, commonly composed of metals and silicon. In experiments, the heat-reflection indices are inferred by measuring the temperature at the surface of the exterior metal after applying heat sources. In this article, we rigorously justify the unique reconstruction of these indices by using such procedures.
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Near total reflection regime has been widely used in X-ray science, specifically in grazing incidence small angle X-ray scattering and in hard X-ray photoelectron spectroscopy. In this work, we introduce some practical aspects of using near total reflection in ambient pressure X-ray photoelectron spectroscopy and apply this technique to study chemical concentration gradients in a substrate/photoresist system. Experimental data are accompanied by X-ray optical and photoemission simulations to quantitatively probe the photoresist and the interface with the depth accuracy of ~1 nm. Together, our calculations and experiments confirm that near total reflection X-ray photoelectron spectroscopy is a suitable method to extract information from buried interfaces with highest depth-resolution, which can help address open research questions regarding our understanding of concentration profiles, electrical gradients, and charge transfer phenomena at such interfaces. The presented methodology is especially attractive for solid/liquid interface studies, since it provides all the strengths of a Bragg-reflection standing-wave spectroscopy without the need of an artificial multilayer mirror serving as a standing wave generator, thus dramatically simplifying the sample synthesis.
The most fundamental response of a solid to a plasma and vice versa is electric. An electric double layer forms with a solid-bound electron-rich region-the wall charge-and a plasma-bound electron-depleted region-the plasma sheath. But it is only the plasma sheath which has been studied extensively ever since the beginning of plasma physics. The wall charge received much less attention. Especially little is known about the in-operando electronic structure of plasma-facing solids and how it affects the spatio-temporal scales of the wall charge. The purpose of this perspective is to encourage investigations of this terra incognito by techniques of modern surface physics. Using our own theoretical explorations of the electron microphysics at plasma-solid interfaces and a proposal for measuring the wall charge by infrared reflectivity to couch the discussion, we hope to put together enough convincing reasons for getting such efforts started. They would open up-at the intersection of plasma and surface physics-a new arena for applied as well as fundamental research.
Scattering from conformal interfaces in two dimensions is universal in that the flux of reflected and transmitted energy does not depend on the details of the initial state. In this letter, we present the first gravitational calculation of energy reflection and transmission coefficients for interfaces with thin-brane holographic duals. Our result for the reflection coefficient depends monotonically on the tension of the dual string anchored at the interface, and obeys the lower bound recently derived from the ANEC in conformal field theory. The B(oundary)CFT limit is recovered for infinite ratio of the central charges.
The existed theories and methods for calculating interfacial thermal conductance of solid-solid interface lead to diverse values that deviate from experimental measurements. In this letter, We propose a model to estimate the ITC at high temperature without comprehensive calculations, where the interface between two dissimilar solids can be treated as an amorphous thin layer and the coordination number density across interface becomes a key parameter. Our model predicts that the ITCs of various interfaces at 300K are in a narrow range: 10$^{7}$W m$^{-2}$K$^{-1}$ $sim $10$^{9}$ W m$^{-2}$ K$^{-1}$, which is in good agreement with the experimental measurement.
Electronic properties of transition metal oxides at interfaces are influenced by strain, electric polarization and oxygen diffusion. Linear dichroism (LD) x-ray absorption, diffraction, transport and magnetization on thin La0.7Sr0.3MnO3 films, allow identification of a peculiar universal interface effect. We report the LD signature of preferential 3d-eg(3z2-r2) occupation at the interface, suppressing the double exchange mechanism. This surface orbital reconstruction is opposite of that favored by residual strain and independent of dipolar fields, chemical nature of the substrate and capping.
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