Few-shot learning aims to learn a classifier using a few labelled instances for each class. Metric-learning approaches for few-shot learning embed instances into a high-dimensional space and conduct classification based on distances among instance embeddings. However, such instance embeddings are usually shared across all episodes and thus lack the discriminative power to generalize classifiers according to episode-specific features. In this paper, we propose a novel approach, namely emph{Episode Adaptive Embedding Network} (EAEN), to learn episode-specific embeddings of instances. By leveraging the probability distributions of all instances in an episode at each channel-pixel embedding dimension, EAEN can not only alleviate the overfitting issue encountered in few-shot learning tasks, but also capture discriminative features specific to an episode. To empirically verify the effectiveness and robustness of EAEN, we have conducted extensive experiments on three widely used benchmark datasets, under various combinations of different generic embedding backbones and different classifiers. The results show that EAEN significantly improves classification accuracy about $10%$ to $20%$ in different settings over the state-of-the-art methods.
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