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Register a new userChanges in electric-field noise due to thermal transformation of a surface ion trap
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We aim to illuminate how the microscopic properties of a metal surface map to its electric-field noise characteristics. In our system, prolonged heat treatments of a metal film can induce a rise in the magnitude of the electric-field noise generated by the surface of that film. We refer to this heat-induced rise in noise magnitude as a thermal transformation. The underlying physics of this thermal transformation process is explored through a series of heating, milling, and electron treatments performed on a single surface ion trap. Between these treatments, $^{40}$Ca$^+$ ions trapped 70 $mu$m above the surface of the metal are used as detectors to monitor the electric-field noise at frequencies close to 1 MHz. An Auger spectrometer is used to track changes in the composition of the contaminated metal surface. With these tools we investigate contaminant deposition, chemical reactions, and atomic restructuring as possible drivers of thermal transformations. The data suggest that the observed thermal transformations can be explained by atomic restructuring at the trap surface. We hypothesize that a rise in local atomic order increases surface electric-field noise in this system.
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We investigate anomalous ion-motional heating, a limitation to multi-qubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multi-zone surface-electrode trap in which ions can be held at five discrete distances from the metal electrodes, we measure power-law dependencies of the electric-field noise experienced by the ion on the ion-electrode distance $d$. We find a scaling of approximately $d^{-4}$ regardless of whether the electrodes are at room temperature or cryogenic temperature, despite the fact that the heating rates are approximately two orders of magnitude smaller in the latter case. Through auxiliary measurements using application of noise to the electrodes, we rule out technical limitations to the measured heating rates and scalings. We also measure frequency scaling of the inherent electric-field noise close to $1/f$ at both temperatures. These measurements eliminate from consideration anomalous-heating models which do not have a $d^{-4}$ distance dependence, including several microscopic models of current interest.
We probe electric-field noise near the metal surface of an ion trap chip in a previously unexplored high-temperature regime. We observe a non-trivial temperature dependence with the noise amplitude at 1-MHz frequency saturating around 500~K. Measurements of the noise spectrum reveal a $1/f^{alphaapprox1}$-dependence and a small decrease in $alpha$ between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally-activated two-level fluctuators with activation energies between 0.35~eV and 0.65~eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example defect motion in the solid state and surface adsorbate binding energies. Studying these processes may aid in identifying the origin of excess electric-field noise in ion traps -- a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.
We probe electric-field noise in a surface ion trap for ion-surface distances $d$ between 50 and 300 $mumathrm{m}$ in the normal and planar directions. We find the noise distance dependence to scale as $d^{-2.6}$ in our trap and a frequency dependence which is consistent with $1/f$ noise. Simulations of the electric-field noise specific to our trap geometry provide evidence that we are not limited by technical noise sources. Our distance scaling data is consistent with a noise correlation length of about 100 $mumathrm{m}$ at the trap surface, and we discuss how patch potentials of this size would be modified by the electrode geometry.
Scaling up trapped-ion quantum computers requires new trap materials to be explored. Here, we present experiments with a surface ion trap made from the high-temperature superconductor YBCO, a promising material for future trap designs. We show that voltage noise from superconducting electrode leads is negligible within the sensitivity $S_V=9times 10^{-20},mathrm{V}^2mathrm{Hz}^{-1}$ of our setup, and for lead dimensions typical for advanced trap designs. Furthermore, we investigate the frequency and temperature dependence of electric field noise above a YBCO surface. We find a $1/f$ spectral dependence of the noise and a non-trivial temperature dependence, with a plateau in the noise stretching over roughly $60,mathrm{K}$. The onset of the plateau coincides with the superconducting transition, indicating a connection between the dominant noise and the YBCO trap material. We exclude the YBCO bulk as origin of the noise and suggest further experiments to decide between the two remaining options explaining the observed temperature dependence: noise screening within the superconducting phase, or surface noise activated by the YBCO bulk through some unknown mechanism.
Electric-field noise from ion-trap electrode surfaces can limit the fidelity of multiqubit entangling operations in trapped-ion quantum information processors and can give rise to systematic errors in trapped-ion optical clocks. The underlying mechanism for this noise is unknown, but it has been shown that the noise amplitude can be reduced by energetic ion bombardment, or ion milling, of the trap electrode surfaces. Using a single trapped $^{88}$Sr$^{+}$ ion as a sensor, we investigate the temperature dependence of this noise both before and after ex situ ion milling of the trap electrodes. Making measurements over a trap electrode temperature range of 4 K to 295 K in both sputtered niobium and electroplated gold traps, we see a marked change in the temperature scaling of the electric-field noise after ion milling: power-law behavior in untreated surfaces is transformed to Arrhenius behavior after treatment. The temperature scaling becomes material-dependent after treatment as well, strongly suggesting that different noise mechanisms are at work before and after ion milling. To constrain potential noise mechanisms, we measure the frequency dependence of the electric-field noise, as well as its dependence on ion-electrode distance, for niobium traps at room temperature both before and after ion milling. These scalings are unchanged by ion milling.
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