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Register a new userDirect imaging of dopant and impurity distributions in 2D MoS$_2$
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Molybdenum disulfide (MoS$_2$) nanosheet is a two-dimensional material with high electron mobility and with high potential for applications in catalysis and electronics. We synthesized MoS$_2$ nanosheets using a one-pot wet-chemical synthesis route with and without Re-doping. Atom probe tomography revealed that 3.8 at.% Re is homogeneously distributed within the Re-doped sheets. Other impurities are found also integrated within the material: light elements including C, N, O, and Na, locally enriched up to 0.1 at.%, as well as heavy elements such as V and W. Analysis of the non-doped sample reveals that the W and V likely originate from the Mo precursor.
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Time-resolved diffuse scattering experiments have gained increasing attention due to their potential to reveal non-equilibrium dynamics of crystal lattice vibrations with full momentum resolution. Although progress has been made in interpreting experimental data on the basis of one-phonon scattering, understanding the role of individual phonons can be sometimes hindered by multi-phonon excitations. In Ref. [arXiv:2103.10108] we have introduced a rigorous approach for the calculation of the all-phonon inelastic scattering intensity of solids from first-principles. In the present work, we describe our implementation in detail and show that multi-phonon interactions are captured efficiently by exploiting translational and time-reversal symmetries of the crystal. We demonstrate its predictive power by calculating the diffraction patterns of monolayer molybdenum disulfide (MoS$_2$), bulk MoS$_2$, and black phosphorus (bP), and we obtain excellent agreement with our measurements of thermal electron diffuse scattering. Remarkably, our results show that multi-phonon excitations dominate in bP across multiple Brillouin zones, while in MoS$_2$ play a less pronounced role. We expand our analysis for each system and we examine the effect of individual atomic and interatomic vibrational motion on the diffuse scattering signals. Our findings indicate that distinct features are explained by the collective displacement of MoS and specific pairs of P atoms. We further demonstrate that the special displacement method reproduces the thermally distorted configuration which generates precisely the all-phonon diffraction pattern. The present methodology opens the way for high-throughput calculations of the scattering intensity in crystals and the accurate interpretation of static and time-resolved diffuse scattering experiments.
Exploration of structure-property relationships as a function of dopant concentration is commonly based on mean field theories for solid solutions. However, such theories that work well for semiconductors tend to fail in materials with strong correlations, either in electronic behavior or chemical segregation. In these cases, the details of atomic arrangements are generally not explored and analyzed. The knowledge of the generative physics and chemistry of the material can obviate this problem, since defect configuration libraries as stochastic representation of atomic level structures can be generated, or parameters of mesoscopic thermodynamic models can be derived. To obtain such information for improved predictions, we use data from atomically resolved microscopic images that visualize complex structural correlations within the system and translate them into statistical mechanical models of structure formation. Given the significant uncertainties about the microscopic aspects of the materials processing history along with the limited number of available images, we combine model optimization techniques with the principles of statistical hypothesis testing. We demonstrate the approach on data from a series of atomically-resolved scanning transmission electron microscopy images of Mo$_x$Re$_{1-x}$S$_2$ at varying ratios of Mo/Re stoichiometries, for which we propose an effective interaction model that is then used to generate atomic configurations and make testable predictions at a range of concentrations and formation temperatures.
To translate electrical into optical signals one uses the modulation of either the refractive index or the absorbance of a material by an electric field. Contemporary electroabsorption modulators (EAMs) employ the quantum confined Stark effect (QCSE), the field-induced red-shift and broadening of the strong excitonic absorption resonances characteristic of low-dimensional semiconductor structures. Here we show an unprecedentedly strong transverse electroabsorption (EA) signal in a monolayer of the two-dimensional semiconductor MoS2. The EA spectrum is dominated by an apparent linewidth broadening of around 15% at a modulated voltage of only Vpp = 0.5 V. Contrary to the conventional QCSE, the signal increases linearly with the applied field strength and arises from a linear variation of the distance between the strongly overlapping exciton and trion resonances. The achievable modulation depths exceeding 0.1 dBnm-1 bear the scope for extremely compact, ultrafast, energy-efficient EAMs for integrated photonics, including on-chip optical communication.
Real-time monitoring is essential for understanding and eventually precise controlling of the growth of two dimensional transition-metal dichalcogenides (2D TMDCs). However, it is very challenging to carry out such kind of studies on chemical vapor deposition (CVD). Here, we report the first real time $in-situ$ study on the CVD growth of the 2D TMDCs. More specifically, CVD growth of molybdenum disulfide (MoS$_2$) monolayer on sapphire substrates has been monitored $in-situ$ using differential transmittance spectroscopy (DTS). The growth of the MoS$_2$ monolayer can be precisely followed by looking at the evolution of the characteristic optical features. Consequently, a strong correlation between the growth rate of MoS$_2$ monolayer and the temperature distribution in the CVD reactor has been revealed. Our result demonstrates the great potential of the real time $in-situ$ optical spectroscopy for the realization of the precisely controlled growth of 2D semiconductor materials.
Monolayer transition metal dichalcogenides are promising materials for photoelectronic devices. Among them, molybdenum disulphide (MoS$_2$) and tungsten disulphide (WS$_2$) are some of the best candidates due to their favorable band gap values and band edge alignments. Here we consider various perturbative corrections to the DFT electronic structure, e.g. GW, spin-orbit coupling, as well as many-body excitonic and trionic effects, and calculate accurate band gaps as a function of homogeneous strain in these materials. We show that all of these corrections are of comparable magnitudes and need to be included in order to obtain an accurate electronic structure. We calculate the strain at which the direct-to-indirect gap transition occurs. After considering all contributions, the direct to indirect gap transition strain is found to be at 2.7% in MoS$_2$ and 3.9% in WS$_2$. These values are generally higher than the previously reported theoretical values.
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