We study numerically the effect of thermal fluctuations and of variable fluid-substrate interactions on the spontaneous dewetting of thin liquid films. To this aim, we use a recently developed lattice Boltzmann method for thin liquid film flows, equipped with a properly devised stochastic term. While it is known that thermal fluctuations yield shorter rupture times, we show that this is a general feature of hydrophilic substrates, irrespective of the contact angle. The ratio between deterministic and stochastic rupture times, though, decreases with $theta$. Finally, we discuss the case of fluctuating thin film dewetting on chemically patterned substrates and its dependence on the form of the wettability gradients.
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