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Odd-even layer-number effect and layer-dependent magnetic phase diagrams in MnBi2Te4

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 Added by Yu Ye
 Publication date 2020
  fields Physics
and research's language is English




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The intrinsic magnetic layered topological insulator MnBi2Te4 with nontrivial topological properties and magnetic order has become a promising system for exploring exotic quantum phenomena such as quantum anomalous Hall effect. However, the layer-dependent magnetism of MnBi2Te4, which is fundamental and crucial for further exploration of quantum phenomena in this system, remains elusive. Here, we use polar reflective magnetic circular dichroism spectroscopy, combined with theoretical calculations, to obtain an in-depth understanding of the layer-dependent magnetic properties in MnBi2Te4. The magnetic behavior of MnBi2Te4 exhibits evident odd-even layer-number effect, i.e. the oscillations of the coercivity of the hysteresis loop (at {mu}0Hc) and the spin-flop transition (at {mu}0H1), concerning the Zeeman energy and magnetic anisotropy energy. In the even-number septuple layers, an anomalous magnetic hysteresis loop is observed, which is attributed to the thickness-independent surface-related magnetization. Through the linear-chain model, we can clarify the odd-even effect of the spin-flop field and determine the evolution of magnetic states under the external magnetic field. The mean-field method also allows us to trace the experimentally observed magnetic phase diagrams to the magnetic fields, layer numbers and especially, temperature. Overall, by harnessing the unusual layer-dependent magnetic properties, our work paves the way for further study of quantum properties of MnBi2Te4.



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A central theme in condensed matter physics is to create and understand the exotic states of matter by incorporating magnetism into topological materials. One prime example is the quantum anomalous Hall (QAH) state. Recently, MnBi2Te4 has been demonstrated to be an intrinsic magnetic topological insulator and the QAH effect was observed in exfoliated MnBi2Te4 flakes. Here, we used molecular beam epitaxy (MBE) to grow MnBi2Te4 films with thickness down to 1 septuple layer (SL) and performed thickness-dependent transport measurements. We observed a non-square hysteresis loop in the antiferromagnetic state for films with thickness greater than 2 SL. The hysteresis loop can be separated into two AH components. Through careful analysis, we demonstrated that one AH component with the larger coercive field is from the dominant MnBi2Te4 phase, while the other AH component with the smaller coercive field is from the minor Mn-doped Bi2Te3 phase in the samples. The extracted AH component of the MnBi2Te4 phase shows a clear even-odd layer-dependent behavior, a signature of antiferromagnetic thin films. Our studies reveal insights on how to optimize the MBE growth conditions to improve the quality of MnBi2Te4 films, in which the QAH and other exotic states are predicted.
Room temperature two-dimensional (2D) ferromagnetism is highly desired in practical spintronics applications. Recently, 1T phase CrTe2 (1T-CrTe2) nanosheets with five and thicker layers have been successfully synthesized, which all exhibit the properties of ferromagnetic (FM) metals with Curie temperatures around 305 K. However, whether the ferromagnetism therein can be maintained when continuously reducing the nanosheets thickness to monolayer limit remains unknown. Here, through first-principles calculations, we explore the evolution of magnetic properties of 1 to 6 layers CrTe2 nanosheets and several interesting points are found: First, unexpectedly, monolayer CrTe2 prefers a zigzag antiferromagnetic (AFM) state with its energy much lower than that of FM state. Second, in 2 to 4 layers CrTe2, both the intralayer and interlayer magnetic coupling are AFM. Last, when the number of layers is equal to or greater than five, the intralayer and interlayer magnetic coupling become FM. Theoretical analysis reveals that the in-plane lattice contraction of few layer CrTe2 compared to bulk is the main factor producing intralayer AFM-FM magnetic transition. At the same time, as long as the intralayer coupling gets FM, the interlayer coupling will concomitantly switch from AFM to FM. Such highly thickness dependent magnetism provides a new perspective to control the magnetic properties of 2D materials.
Being an antiferromagnetic topological insulator (AFM-TI), MnBi2Te4 offers an ideal platform to study the interplay between magnetism and topological order. We combine both transport and scanning microwave impedance microscopy (sMIM) to examine such interplay in atomically thin MnBi2Te4 with even-layer thickness. Transport measurement shows a quantized Hall resistivity under a magnetic field above 6 T signaling a Chern insulator phase, and a zero Hall plateau at low fields consistent with axion insulator phase. With sMIM, we directly visualize a magnetic-field-driven insulator-to-metal (IMT) transition of the bulk resulting from a quantum phase transition from a Chern insulator to axion insulator phase. Strikingly, sMIM reveals a persistent edge state across the transition. The observed edge state at low fields, in particular at zero field, calls for careful considerations for the topological nature of its bulk state. We discuss the possibility of having edge states in the context of axion insulator and beyond such a context. Our finding signifies the richness of topological phases in MnB2Te4 that has yet to be fully explored.
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Correct defect quantification in graphene samples is crucial both for fundamental and applied re-search. Raman spectroscopy represents the most widely used tool to identify defects in graphene. However, despite its extreme importance the relation between the Raman features and the amount of defects in multilayered graphene samples has not been experimentally verified. In this study we intentionally created defects in single layer graphene, turbostratic bilayer graphene and Bernal stacked bilayer graphene by oxygen plasma. By employing isotopic labelling, our study reveals substantial differences of the effects of plasma treatment on individual layers in bilayer graphene with different stacking orders. In addition Raman spectroscopy evidences scattering of phonons in the bottom layer by defects in the top layer for Bernal-stacked samples, which can in general lead to overestimation of the number of defects by as much as a factor of two.
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