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Register a new userOn low-energy tail distortions in the detector responsefunction of x-ray microcalorimeter spectrometers
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We use narrow spectral lines from the x-ray spectra of various highlycharged ions to measure low-energy tail-like deviations from a Gaussian responsefunction in a microcalorimter x-ray spectrometer with Au absorbers at energiesfrom 650 eV to 3320 eV. We review the literature on low energy tails in othermicrocalorimter x-ray spectrometers and present a model that explains all thereviewed tail fraction measurements. In this model a low energy tail arises fromthe combination of electron escape and energy trapping associated with Bi x-rayabsorbers.
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Operation of an X-ray spectrometer based on a spherical variable line spacing grating is analyzed using dedicated ray-tracing software allowing fast optimization of the grating parameters and spectrometer geometry. The analysis is illustrated with optical design of a model spectrometer to deliver a resolving power above 20400 at photon energy of 930 eV (Cu L-edge). With this energy taken as reference, the VLS coefficients are optimized to cancel the lineshape asymmetry (mostly from the coma aberrations) as well as minimize the symmetric aberration broadening at large grating illuminations, dramatically increasing the aberration-limited vertical acceptance of the spectrometer. For any energy away from the reference, we evaluate corrections to the entrance arm and light incidence angle on the grating to maintain the exactly symmetric lineshape. Furthermore, we evaluate operational modes when these corrections are coordinated to maintain either energy independent focal curve inclination or maximal aberration-limited spectrometer acceptance. The results are supported by analytical evaluation of the coma term of the optical path function. Our analysis gives thus a recipe to design a high-resolution spherical VLS grating spectrometer operating with negligible aberrations at large acceptance and over extended energy range.
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We fabricated a superconducting single X-ray photon detector based on W0.8Si0.2, and we characterized its basic detection performance for keV-photons at different temperatures. The detector has a critical temperature of 4.97 K, and it is able to be operated up to 4.8 K, just below the critical temperature. The detector starts to react to X-ray photons at relatively low bias currents, less than 1% of Ic at T = 1.8 K, and it shows a saturated count rate dependence on bias current at all temperatures, indicating that the optimum internal quantum efficiency can always be reached. Dark counts are negligible up to the highest investigated bias currents (99% of Ic) and operating temperature (4.8 K). The latching effect affects the detector performance at all temperatures due to the fast recovery of the bias current; however, further modifications of the device geometry are expected to reduce the tendency for latching.
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