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Register a new userSENSEI: Direct-Detection Results on sub-GeV Dark Matter from a New Skipper-CCD
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We present the first direct-detection search for eV-to-GeV dark matter using a new ~2-gram high-resistivity Skipper-CCD from a dedicated fabrication batch that was optimized for dark-matter searches. Using 24 days of data acquired in the MINOS cavern at the Fermi National Accelerator Laboratory, we measure the lowest rates in silicon detectors of events containing one, two, three, or four electrons, and achieve world-leading sensitivity for a large range of sub-GeV dark matter masses. Data taken with different thicknesses of the detector shield suggest a correlation between the rate of high-energy tracks and the rate of single-electron events previously classified as dark current. We detail key characteristics of the new Skipper-CCDs, which augur well for the planned construction of the ~100-gram SENSEI experiment at SNOLAB.
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We present new direct-detection constraints on eV-to-GeV dark matter interacting with electrons using a prototype detector of the Sub-Electron-Noise Skipper-CCD Experimental Instrument. The results are based on data taken in the MINOS cavern at the Fermi National Accelerator Laboratory. We focus on data obtained with two distinct readout strategies. For the first strategy, we read out the Skipper-CCD continuously, accumulating an exposure of 0.177 gram-days. While we observe no events containing three or more electrons, we find a large one- and two-electron background event rate, which we attribute to spurious events induced by the amplifier in the Skipper-CCD readout stage. For the second strategy, we take five sets of data in which we switch off all amplifiers while exposing the Skipper-CCD for 120k seconds, and then read out the data through the best prototype amplifier. We find a one-electron event rate of (3.51 +- 0.10) x 10^(-3) events/pixel/day, which is almost two orders of magnitude lower than the one-electron event rate observed in the continuous-readout data, and a two-electron event rate of (3.18 +0.86 -0.55) x 10^(-5) events/pixel/day. We again observe no events containing three or more electrons, for an exposure of 0.069 gram-days. We use these data to derive world-leading constraints on dark matter-electron scattering for masses between 500 keV to 5 MeV, and on dark-photon dark matter being absorbed by electrons for a range of masses below 12.4 eV.
The Sub-Electron-Noise Skipper CCD Experimental Instrument (SENSEI) uses the recently developed Skipper-CCD technology to search for electron recoils from the interaction of sub-GeV dark matter particles with electrons in silicon. We report first results from a prototype SENSEI detector, which collected 0.019 gram-days of commissioning data above ground at Fermi National Accelerator Laboratory. These commissioning data are sufficient to set new direct-detection constraints for dark matter particles with masses between ~500 keV and 4 MeV. Moreover, since these data were taken on the surface, they disfavor previously allowed strongly interacting dark matter particles with masses between ~500 keV and a few hundred MeV. We discuss the implications of these data for several dark matter candidates, including one model proposed to explain the anomalously large 21-cm signal observed by the EDGES Collaboration. SENSEI is the first experiment dedicated to the search for electron recoils from dark matter, and these results demonstrate the power of the Skipper-CCD technology for dark matter searches.
We use a science-grade Skipper Charge Coupled Device (Skipper-CCD) operating in a low-radiation background environment to develop a semi-empirical model that characterizes the origin of single-electron events in CCDs. We identify, separate, and quantify three independent contributions to the single-electron events, which were previously bundled together and classified as ``dark counts: dark current, amplifier light, and spurious charge. We measure a dark current, which depends on exposure, of (5.89+-0.77)x10^-4 e-/pix/day, and an unprecedentedly low spurious charge contribution of (1.52+-0.07)x10^-4 e-/pix, which is exposure-independent. In addition, we provide a technique to study events produced by light emitted from the amplifier, which allows the detectors operation to be optimized to minimize this effect to a level below the dark-current contribution. Our accurate characterization of the single-electron events allows one to greatly extend the sensitivity of experiments searching for dark matter or coherent neutrino scattering. Moreover, an accurate understanding of the origin of single-electron events is critical to further progress in ongoing R&D efforts of Skipper and conventional CCDs.
We examine the consequences of the effective field theory (EFT) of dark matter-nucleon scattering for current and proposed direct detection experiments. Exclusion limits on EFT coupling constants computed using the optimum interval method are presented for SuperCDMS Soudan, CDMS II, and LUX, and the necessity of combining results from multiple experiments in order to determine dark matter parameters is discussed. We demonstrate that spectral differences between the standard dark matter model and a general EFT interaction can produce a bias when calculating exclusion limits and when developing signal models for likelihood and machine learning techniques. We also discuss the implications of the EFT for the next-generation (G2) direct detection experiments and point out regions of complementarity in the EFT parameter space.
Several direct detection experiments, including recently CDMS-II, have reported signals consistent with 5 to 10 GeV dark matter (DM) that appear to be in tension with null results from XENON and LUX experiments; these indicate a careful review of the theoretical basis, including the galactic DM velocity distribution function (VDF). We establish a VDF parameter space from DM-only cosmological simulations and illustrate that seemingly contradictory experimental results can be made consistent within this parameter space. Future experimental limits should be reported after they are marginalized over a range of VDF parameters.
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