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Register a new userAddressing band-edge-property spatial variations and localized-state carrier trapping and recombination in solar cell numerical modeling
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Conduction and valence band-edge-property variations with position as well as defects giving rise to localized states in the energy gap can play a significant role in determining solar cell performance. Understanding their effects on a device is necessary in interpreting complex experimental observations and in optimizing the performance of solar cells. In this overview, we include the effective forces arising from electron and hole band-edge-property variations with position in a numerical formulation of solar cell performance. Further we systematically catalogue and review a variety of localized states with different types and distributions, and include in our numerical transport model the carrier trapping, electric field modification, and recombination caused by these localized states. The successful implementation of the numerical modeling of band-edge-property variations and defect state effects is demonstrated using the methodology of the solar cell simulation code Analysis of Microelectronic and Photonic Structures (AMPS) and its derivatives.
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We investigate nongeminate recombination in organic solar cells based on copper phthalocyanine (CuPc) and C$_{60}$. Two device architectures, the planar heterojunction (PHJ) and the bulk heterojunction (BHJ), are directly compared in view of differences in charge carrier decay dynamics. We apply a combination of transient photovoltage (TPV) experiments, yielding the small perturbation charge carrier lifetime, and charge extraction measurements, providing the charge carrier density. In organic solar cells, charge photogeneration and recombination primarily occur at the donor--acceptor heterointerface. Whereas the BHJ can often be approximated by an effective medium due to rather small scale phase separation, the PHJ has a well defined two-dimensional heterointerface. To study recombination dynamics in PHJ devices most relevant is the charge accumulation at this interface. As from extraction techniques only the spatially averaged carrier concentration can be determined, we derive the charge carrier density at the interface $n_{int}$ from the open circuit voltage. Comparing the experimental results with macroscopic device simulation we discuss the differences of recombination and charge carrier densities in CuPc:C$_{60}$ PHJ and BHJ devices with respect to the device performance. The open circuit voltage of BHJ is larger than for PHJ at low light intensities, but at 0.3 sun the situation is reversed: here, the PHJ can finally take advantage of its generally longer charge carrier lifetimes, as the active recombination region is smaller.
A combination of transient photovoltage (TPV), voltage dependent charge extraction (CE) and time delayed collection field (TDCF) measurements is applied to poly[[4,8-bis[(2-ethylhexyl)oxy]benzo[1,2-b:4,5-b]dithiophene-2,6-diyl] [3-fluoro-2-[(2-ethylhexyl)carbonyl] thieno[3,4-b]thiophenediyl]] (PTB7):[6,6]-phenyl-C71-butyric acid (PC$_{71}$BM) bulk heterojunction solar cells to analyze the limitations of photovoltaic performance. Devices are processed from pure chlorobenzene (CB) solution and a subset was optimized with 1,8-diiodooctane (DIO) as co-solvent. The dramatic changes in device performance are discussed with respect to the dominating loss processes. While in the devices processed from CB solution, severe geminate and nongeminate recombination is observed, the use of DIO facilitates efficient polaron pair dissociation and minimizes geminate recombination. Thus, from the determined charge carrier decay rate under open circuit conditions and the voltage dependent charge carrier densities $n(V)$, the nongeminate loss current $j_{loss}$ of the samples with DIO alone enables us to reconstruct the current/voltage ($j/V$) characteristics across the whole operational voltage range. Geminate and nongeminate losses are considered to describe the $j/V$ response of cells prepared without additive, but lead to a clearly overestimated device performance. We attribute the deviation between measured and reconstructed $j/V$ characteristics to trapped charges in isolated domains of pure fullerene phases.
Majority and minority carrier properties such as type, density and mobility represent fundamental yet difficult to access parameters governing semiconductor device performance, most notably solar cells. Obtaining this information simultaneously under light illumination would unlock many critical parameters such as recombination lifetime, recombination coefficient, and diffusion length; while deeply interesting for optoelectronic devices, this goal has remained elusive. We demonstrate here a new carrier-resolved photo-Hall technique that rests on a new identity relating hole-electron mobility difference ($Deltamu$), Hall coefficient ($h$), and conductivity ($sigma$): $Deltamu=(2+dln h/dln sigma),h,sigma$, and a rotating parallel dipole line ac-field Hall system with Fourier/lock-in detection for clean Hall signal measurement. We successfully apply this technique to recent world-record-quality perovskite and kesterite films and map the results against varying light intensities, demonstrating unprecedented simultaneous access to the above-mentioned parameters.
This work introduces a new software package `Sesame for the numerical computation of classical semiconductor equations. It supports 1 and 2-dimensional systems and provides tools to easily implement extended defects such as grain boundaries or sample surfaces. Sesame has been designed to facilitate fast exploration of the system parameter space and to visualize local charge transport properties. Sesame is distributed as a Python package or as a standalone GUI application, and is available at https://pages.nist.gov/sesame/ .
A quite general device analysis method that allows the direct evaluation of optical and recombination losses in crystalline silicon (c-Si)-based solar cells has been developed. By applying this technique, the optical and physical limiting factors of the state-of-the-art solar cells with ~20% efficiencies have been revealed. In the established method, the carrier loss mechanisms are characterized from the external quantum efficiency (EQE) analysis with very low computational cost. In particular, the EQE analyses of textured c-Si solar cells are implemented by employing the experimental reflectance spectra obtained directly from the actual devices while using flat optical models without any fitting parameters. We find that the developed method provides almost perfect fitting to EQE spectra reported for various textured c-Si solar cells, including c-Si heterojunction solar cells, a dopant-free c-Si solar cell with a MoOx layer, and an n-type passivated emitter with rear locally diffused (PERL) solar cell. The modeling of the recombination loss further allows the extraction of the minority carrier diffusion length and surface recombination velocity from the EQE analysis. Based on the EQE analysis results, the carrier loss mechanisms in different types of c-Si solar cells are discussed.
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