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Register a new userSynchrotron x-ray scattering of UN and U2N3 epitaxial films
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Added by
Eleanor Lawrence Bright
Publication date
2019
fields
Physics
and research's language is
English
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We examine the magnetic ordering of UN and of a closely related nitride, U2N3, by preparing thin epitaxial films and using synchrotron x-ray techniques. The magnetic configuration and subsequent coupling to the lattice are key features of the electronic structure. The well-known antiferromagnetic (AF) ordering of UN is confirmed, but the expected accompanying distortion at Tn is not observed. Instead, we propose that the strong magneto-elastic interaction at low temperature involves changes in the strain of the material. These strains vary as a function of the sample form. As a consequence, the accepted AF configuration of UN may be incorrect. In the case of cubic a-U2N3, no single crystals have been previously prepared, and we have determined the AF ordering wave-vector. The AF Tn is close to that previously reported. In addition, resonant diffraction methods have identified an aspherical quadrupolar charge contribution in U2N3 involving the 5f electrons; the first time this has been observed in an actinide compound.
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Single crystal epitaxial thin films of UN and U$_2$N$_3$ have been grown for the first time by reactive DC magnetron sputtering. These films provide ideal samples for fundamental research into the potential accident tolerant fuel, UN, and U$_2$N$_3$, its intermediate oxidation product. Films were characterised using x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), with XRD analysis showing both thin films to be [001] oriented and composed of a single domain. The specular lattice parameters of the UN and U$_2$N$_3$ films were found to be 4.895,AA{} and 10.72,AA{}, respectively, with the UN film having a miscut of 2.6,$^circ$. XPS showed significant differences in the N-1s peak between the two films, with area analysis showing both films to be stoichiometric.
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