The Derivation of Failure Event Correlation Based on Shadowing Cross-Correlation
published by Piergiuseppe Di Marco
in 2019
in Electronic Engineering
and research's language is
English
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Abstract in English
In this document we derive the mapping between the failure event correlation and shadowing cross-correlation in dual connectivity architectures. In this case, we assume that a single UE is connected to two gNBs (next generation NodeB).