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Long short-term memory networks in memristor crossbars

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 Added by Qiangfei Xia
 Publication date 2018
and research's language is English




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Recent breakthroughs in recurrent deep neural networks with long short-term memory (LSTM) units has led to major advances in artificial intelligence. State-of-the-art LSTM models with significantly increased complexity and a large number of parameters, however, have a bottleneck in computing power resulting from limited memory capacity and data communication bandwidth. Here we demonstrate experimentally that LSTM can be implemented with a memristor crossbar, which has a small circuit footprint to store a large number of parameters and in-memory computing capability that circumvents the von Neumann bottleneck. We illustrate the capability of our system by solving real-world problems in regression and classification, which shows that memristor LSTM is a promising low-power and low-latency hardware platform for edge inference.



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Brain-inspired computing and neuromorphic hardware are promising approaches that offer great potential to overcome limitations faced by current computing paradigms based on traditional von-Neumann architecture. In this regard, interest in developing memristor crossbar arrays has increased due to their ability to natively perform in-memory computing and fundamental synaptic operations required for neural network implementation. For optimal efficiency, crossbar-based circuits need to be compatible with fabrication processes and materials of industrial CMOS technologies. Herein, we report a complete CMOS-compatible fabrication process of TiO2-based passive memristor crossbars with 700 nm wide electrodes. We show successful bottom electrode fabrication by a damascene process, resulting in an optimised topography and a surface roughness as low as 1.1 nm. DC sweeps and voltage pulse programming yield statistical results related to synaptic-like multilevel switching. Both cycle-to-cycle and device-to-device variability are investigated. Analogue programming of the conductance using sequences of 200 ns voltage pulses suggest that the fabricated memories have a multilevel capacity of at least 3 bits due to the cycle-to-cycle reproducibility.
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