A Note on Polynomial Identity Testing for Depth-3 Circuits

Let $C$ be a depth-3 arithmetic circuit of size at most $s$, computing a polynomial $ f in mathbb{F}[x_1,ldots, x_n] $ (where $mathbb{F}$ = $mathbb{Q}$ or $mathbb{C}$) and the fan-in of the product gates of $C$ is bounded by $d$. We give a deterministic polynomial identity testing algorithm to check whether $fequiv 0$ or not in time $ 2^d text{ poly}(n,s) $.