The Soft X-ray Imager (SXI) is an imaging spectrometer using charge-coupled devices (CCDs) aboard the Hitomi X-ray observatory. The SXI sensor has four CCDs with an imaging area size of $31~{rm mm} times 31~{rm mm}$ arranged in a $2 times 2$ array. Combined with the X-ray mirror, the Soft X-ray Telescope, the SXI detects X-rays between $0.4~{rm keV}$ and $12~{rm keV}$ and covers a $38^{prime} times 38^{prime}$ field-of-view. The CCDs are P-channel fully-depleted, back-illumination type with a depletion layer thickness of $200~mu{rm m}$. Low operation temperature down to $-120~^circ{rm C}$ as well as charge injection is employed to reduce the charge transfer inefficiency of the CCDs. The functionality and performance of the SXI are verified in on-ground tests. The energy resolution measured is $161$-$170~{rm eV}$ in full width at half maximum for $5.9~{rm keV}$ X-rays. In the tests, we found that the CTI of some regions are significantly higher. A method is developed to properly treat the position-dependent CTI. Another problem we found is pinholes in the Al coating on the incident surface of the CCDs for optical light blocking. The Al thickness of the contamination blocking filter is increased in order to sufficiently block optical light.
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