No Arabic abstract
Organic Photovoltaic devices (OPVs) are becoming adequately cost and energy efficient to be considered a good investment and it is, therefore, especially important to have a concrete understanding of their operation. We compute energies of charge-transfer (CT) states of the model donor-acceptor lattice system with varying degrees of structural disorder to investigate how fluctuations in the material properties affect electron-hole separation. We also demonstrate how proper statistical treatment of the CT energies recovers experimentally observed hot and cold exciton dissociation pathways. Using a quantum mechanical model for a model heterojunction interface, we recover experimental values for the open-circuit voltage at 50 and 100meV of site-energy disorder. We find that energetic and conformational disorder generally facilitates charge transfer; however, due to excess energy supplied by photoexcitation, highly energetic electron-hole pairs can dissociate in unfavorable directions, potentially never contributing to the photocurrent. We find that cold excitons follow the free energy curve defined at the operating temperature of the device. Our results provide a unifying picture linking various proposed mechanisms for charge separation.
Graphene has shown great application opportunities in future nanoelectronic devices due to its outstanding electronic properties. Moreover, its impressive optical properties have been attracting the interest of researchers, and, recently, the photovoltaic effects of a heterojunction structure embedded with few layer graphene (FLG) have been demonstrated. Here, we report the photovoltaic response of graphene-semiconductor junctions and the controlled open-circuit voltage (Voc) with varying numbers of graphene layers. After unavoidably adsorbed contaminants were removed from the FLGs, by means of in situ annealing, prepared by layer-by-layer transfer of the chemically grown graphene layer, the work functions of FLGs showed a sequential increase as the graphene layers increase, despite of random interlayer-stacking, resulting in the modulation of photovoltaic behaviors of FLGs/Si interfaces. The surface photovoltaic effects observed here show an electronic realignment in the depth direction in the FLG heterojunction systems, indicating future potential toward solar devices utilizing the excellent transparency and flexibility of FLG.
In organic bulk heterojunction solar cells, the open circuit voltage ($V_mathrm{oc}$) suffers from an ultra-high loss at low temperatures. In this work we investigate the origin of the loss through calculating the $V_mathrm{oc}-T$ plots with the device model method systematically and comparing it with experimentally observed ones. When the energetic disorder is incorporated into the model by considering the disorder-suppressed and temperature-dependent charge carrier mobilities, it is found that for nonselective contacts the $V_mathrm{oc}$ reduces drastically under the low temperature regime, while for selective contacts the $V_mathrm{oc}$ keeps increasing with the decreasing temperature. The main reason is revealed that as the temperature decreases, the reduced mobilities give rise to low charge extraction efficiency and small bimolecular recombination rate for the photogenerated charge carriers, so that in the former case they can be extracted from the wrong electrode to form a leakage current which counteracts the photocurrent and increases quickly with voltage, leading to the anomalous reduction of $V_mathrm{oc}$. In addition, it is revealed that the charge generation rate is slow-varying with temperature and does not induce significant $V_mathrm{oc}$ loss. This work also provides a comprehensive picture for the $V_mathrm{oc}$ behavior under varying device working conditions.
Fundamental electronic processes such as charge-carrier transport and recombination play a critical role in determining the efficiency of hybrid perovskite solar cells. The presence of mobile ions complicates the development of a clear understanding of these processes as the ions may introduce exceptional phenomena such as hysteresis or giant dielectric constants. As a result, the electronic landscape, including its interaction with mobile ions, is difficult to access both experimentally and analytically. To address this challenge, we applied a series of small perturbation techniques including impedance spectroscopy (IS), intensity-modulated photocurrent spectroscopy (IMPS) and intensity-modulated photovoltage spectroscopy (IMVS) to planar $mathrm{MAPbI_3}$ perovskite solar cells. Our measurements indicate that both electronic as well as ionic responses can be observed in all three methods and assigned by literature comparison. The results reveal that the dominant charge-carrier loss mechanism is surface recombination by limitation of the quasi-Fermi level splitting. The interaction between mobile ions and the electronic charge carriers leads to a shift of the apparent diode ideality factor from 0.74 to 1.64 for increasing illumination intensity, despite the recombination mechanism remaining unchanged.
The presence of interface recombination in a complex multilayered thin-film solar structure causes a disparity between the internal open-circuit voltage (VOC,in), measured by photoluminescence, and the external open-circuit voltage (VOC,ex) i.e. an additional VOC deficit. Higher VOC,ex value aim require a comprehensive understanding of connection between VOC deficit and interface recombination. Here, a deep near-surface defect model at the absorber/buffer interface is developed for copper indium di-selenide solar cells grown under Cu excess conditions to explain the disparity between VOC,in and VOC,ex.. The model is based on experimental analysis of admittance spectroscopy and deep-level transient spectroscopy, which show the signature of deep acceptor defect. Further, temperature-dependent current-voltage measurements confirm the presence of near surface defects as the cause of interface recombination. The numerical simulations show strong decrease in the local VOC,in near the absorber/buffer interface leading to a VOC deficit in the device. This loss mechanism leads to interface recombination without a reduced interface bandgap or Fermi level pinning. Further, these findings demonstrate that the VOC,in measurements alone can be inconclusive and might conceal the information on interface recombination pathways, establishing the need for complementary techniques like temperature dependent current voltage measurements to identify the cause of interface recombination in the devices.
There is evidence that interface recombination in Cu2ZnSnS4 solar cells contributes to the open-circuit voltage deficit. Our hybrid density functional theory calculations suggest that electron-hole recombination at the Cu2ZnSnS4/CdS interface is caused by a deeper conduction band that slows electron extraction. In contrast, the bandgap is not narrowed for the Cu2ZnSnSe4/CdS interface, consistent with a lower open-circuit voltage deficit.