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Register a new user3D Modeling of Electric Fields in the LUX Detector
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This work details the development of a three-dimensional (3D) electric field model for the LUX detector. The detector took data during two periods of searching for weakly interacting massive particle (WIMP) searches. After the first period completed, a time-varying non-uniform negative charge developed in the polytetrafluoroethylene (PTFE) panels that define the radial boundary of the detectors active volume. This caused electric field variations in the detector in time, depth and azimuth, generating an electrostatic radially-inward force on electrons on their way upward to the liquid surface. To map this behavior, 3D electric field maps of the detectors active volume were built on a monthly basis. This was done by fitting a model built in COMSOL Multiphysics to the uniformly distributed calibration data that were collected on a regular basis. The modeled average PTFE charge density increased over the course of the exposure from -3.6 to $-5.5~mu$C/m$^2$. From our studies, we deduce that the electric field magnitude varied while the mean value of the field of $sim200$~V/cm remained constant throughout the exposure. As a result of this work the varying electric fields and their impact on event reconstruction and discrimination were successfully modeled.
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The $(x, y)$ position reconstruction method used in the analysis of the complete exposure of the Large Underground Xenon (LUX) experiment is presented. The algorithm is based on a statistical test that makes use of an iterative method to recover the photomultiplier tube (PMT) light response directly from the calibration data. The light response functions make use of a two dimensional functional form to account for the photons reflected on the inner walls of the detector. To increase the resolution for small pulses, a photon counting technique was employed to describe the response of the PMTs. The reconstruction was assessed with calibration data including ${}^{mathrm{83m}}$Kr (releasing a total energy of 41.5 keV) and ${}^{3}$H ($beta^-$ with Q = 18.6 keV) decays, and a deuterium-deuterium (D-D) neutron beam (2.45 MeV). In the horizontal plane, the reconstruction has achieved an $(x, y)$ position uncertainty of $sigma$= 0.82 cm for events of only 200 electroluminescence photons and $sigma$ = 0.17 cm for 4,000 electroluminescence photons. Such signals are associated with electron recoils of energies $sim$0.25 keV and $sim$10 keV, respectively. The reconstructed position of the smallest events with a single electron emitted from the liquid surface has a horizontal $(x, y)$ uncertainty of 2.13 cm.
We show that doubly peaked electric fields are necessary to describe grazing-angle charge collection measurements of irradiated silicon pixel sensors. A model of irradiated silicon based upon two defect levels with opposite charge states and the trapping of charge carriers can be tuned to produce a good description of the measured charge collection profiles in the fluence range from 0.5x10^{14} Neq/cm^2 to 5.9x10^{14} Neq/cm^2. The model correctly predicts the variation in the profiles as the temperature is changed from -10C to -25C. The measured charge collection profiles are inconsistent with the linearly-varying electric fields predicted by the usual description based upon a uniform effective doping density. This observation calls into question the practice of using effective doping densities to characterize irradiated silicon.
We report here methods and techniques for creating and improving a model that reproduces the scintillation and ionization response of a dual-phase liquid and gaseous xenon time-projection chamber. Starting with the recent release of the Noble Element Simulation Technique (NEST v2.0), electronic recoil data from the $beta$ decays of ${}^3$H and ${}^{14}$C in the Large Underground Xenon (LUX) detector were used to tune the model, in addition to external data sets that allow for extrapolation beyond the LUX data-taking conditions. This paper also presents techniques used for modeling complicated temporal and spatial detector pathologies that can adversely affect data using a simplified model framework. The methods outlined in this report show an example of the robust applications possible with NEST v2.0, while also providing the final electronic recoil model and detector parameters that will used in the new analysis package, the LUX Legacy Analysis Monte Carlo Application (LLAMA), for accurate reproduction of the LUX data. As accurate background reproduction is crucial for the success of rare-event searches, such as dark matter direct detection experiments, the techniques outlined here can be used in other single-phase and dual-phase xenon detectors to assist with accurate ER background reproduction.
Dual phase xenon detectors are widely used in experimental searches for galactic darkmatter particles. The origin of single electron backgrounds following prompt scintillation and proportional scintillation signals in these detectors is not fully understood, although there has been progress in recent years. In this paper, we describe single electron backgrounds in ${}^{83m}Kr$ calibration events and their correlation with drift and extraction fields, using the Particle Identification in Xenon at Yale (PIXeY) dual-phase xenon time projection chamber. The single electron background induced by the Fowler-Nordheim (FN) effect is measured, and its electric field dependence is quantified. The photoionization of grids and impurities by prompt scintillation and proportional scintillation also contributes to the single electron background.
Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron emission. We discuss how these backgrounds can be mitigated in LUX and future xenon-based dark matter experiments.
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