We propose a new technique to measure the infrared scintillation light yield of rare earth (RE) doped crystals by comparing it to near UV-visible scintillation of a calibrated Pr:(Lu$_{0.75}$Y$_{0.25}$)$_{3}$Al$_5$O$_{12}$ sample. As an example, we apply this technique to provide the light yield in visible and infrared range up to SI{1700}{nm} of this crystal.
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