Current-voltage dependence is measured in (Ga,Sb)-doped ZnO up to 150 kV/cm electric fields. A channel temperature is controlled by applying relatively short (few ns) voltage pulses to two-terminal samples. The dependence of electron drift velocity on electron density ranging from 1.42$times$10$^{17}$ cm$^{-3}$ to 1.3$times$10$^{20}$ cm$^{-3}$ at a given electric field is deduced after estimation of the sample contact resistance and the Hall electron mobility. Manifestation of the highest electron drift velocity up to $sim$1.5$times$10$^{7}$ cm/s is estimated for electron density of 1.42$times$10$^{17}$ cm$^{-3}$ and is in agreement with Monte Carlo simulation when hot-phonon lifetime is below 1 ps. A local drift velocity maximum is observed at $sim$1.1$times$10$^{19}$ cm$^{-3}$ and is in agreement with ultra-fast hot phonon decay.
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