Knowledge gained through X-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. Atomic details of sample structures is achievable by X-ray crystallography, however, it is only applied to crystalline structures. Imaging techniques based on X-ray coherent diffraction or zone plates are capable of resolving the internal structure of non-crystalline materials at nanoscales, but it is still a challenge to achieve atomic resolution. Here we demonstrate a novel lensless Fourier-transform ghost imaging method with pseudo-thermal hard X-rays by measuring the second-order intensity correlation function of the light. We show that high resolution Fourier-transform diffraction pattern of a complex amplitude sample can be achieved at Fresnel region and the amplitude and phase distributions of a sample in spatial domain can be retrieved successfully. The method of lensless X-ray Fourier-transform ghost imaging extends X-ray crystallography to non-crystalline samples, and its spatial resolution is limited only by the wavelength of the X-ray, thus atomic resolution should be routinely obtainable. Since highly coherent X-ray source is not required, comparing to conventional X-ray coherent diffraction imaging, the method can be implemented with laboratory X-ray sources, and it also provides a potential solution for lensless diffraction imaging with fermions, such as neutron and electron where the intensive coherent source usually is not available.
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