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Probing the localization length of photo-generated charges in organic materials

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 Publication date 2013
  fields Physics
and research's language is English




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We report a new experimental method to measure the localization length of photo-generated carriers in an organic donor-acceptor photovoltaic blend by comparing their dielectric and electron spin-resonance susceptibilities which are simultaneously measured by monitoring the resonance frequency of a superconducting resonator. We show that at cryogenic temperatures excitons are dissociated into long lived states, but that these are confined within a separation of around $4;{rm nm}$. We determine the Debye and recombination times, showing the coexistence of a fast electrical response corresponding to delocalized motion, with glass-like recombination kinetics.

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An in-depth analysis of valley physics in 2D materials like transition metal dichalcogenides requires the measurement of many material properties as a function of Fermi level position within the electronic band structure. This is normally done by changing the charge carrier density of the 2D material via the gate electric field effect. Here, we show that a comparison of gate-dependent measurements, which were acquired under different measurement conditions can encounter significant problems due to the temporal evolution of the charging of trap states inside the dielectric layer or at its interfaces. The impact of, e.g., the gate sweep direction and the sweep rate on the overall gate dependence gets especially prominent in optical measurements due to photo-excitation of donor and acceptor states. Under such conditions the same nominal gate-voltage may lead to different gate-induced charge carrier densities and, hence, Fermi level positions. We demonstrate that a current flow from or even through the dielectric layer via leakage currents can significantly diminish the gate tunability in optical measurements of 2D materials.
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