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Register a new userInterface characterization of Co2MnGe/Rh2CuSn Heusler multilayers
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All-Heusler multilayer structures have been investigated by means of high kinetic x-ray photoelectron spectroscopy and x-ray magnetic circular dichroism, aiming to address the amount of disorder and interface diffusion induced by annealing of the multilayer structure. The studied multilayers consist of ferromagnetic Co$_2$MnGe and non-magnetic Rh$_2$CuSn layers with varying thicknesses. We find that diffusion begins already at comparably low temperatures between 200 $^{circ}$C and 250 $^{circ}$C, where Mn appears to be most prone to diffusion. We also find evidence for a 4 {AA} thick magnetically dead layer that, together with the identified interlayer diffusion, are likely reasons for the small magnetoresistance found for current-perpendicular-to-plane giant magneto-resistance devices based on this all-Heusler system.
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Our Introduction starts with a short general review of the magnetic and structural properties of the Heusler compounds which are under discussion in this book. Then, more specifically, we come to the discussion of our experimental results on multilayers composed of the Heusler alloys Co2MnGe and Co2MnSn with V or Au as interlayers. The experimental methods we apply combine magnetization and magneto-resistivity measurements, x-ray diffraction and reflectivity, soft x-ray magnetic circular dichroism and spin polarized neutron reflectivity. We find that below a critical thickness of the Heusler layers at typically dcr = 1.5 nm the ferromagnetic order is lost and spin glass order occurs instead. For very thin ferromagnetic Heusler layers there are peculiarities in the magnetic order which are unusual when compared to conventional ferromagnetic transition metal multilayer systems. In [Co2MnGe/Au] multilayers there is an exchange bias shift at the ferromagnetic hysteresis loops at low temperatures caused by spin glass ordering at the interface. In [Co2MnGe/V] multilayers we observe an antiferromagnetic interlayer long range ordering below a well defined Neel temperature originating from the dipolar stray fields at the magnetically rough Heusler layer interfaces.
HRTEM, nano-beam electronic diffraction, energy dispersive X-rays scanning spectroscopy, Vibrating Sample Magnetometry (VSM) and FerroMagnetic Resonance (FMR) techniques are used in view of comparing (static and dynamic) magnetic and structural properties of Co2MnGe (13 nm)/Al2O3 (3 nm)/Co (13 nm) tunnel magnetic junctions (TMJ), deposited on various single crystalline substrates (a-plane sapphire, MgO(100) and Si(111)). They allow for providing a correlation between these magnetic properties and the fine structure investigated at atomic scale. The Al2O3 tunnel barrier is always amorphous and contains a large concentration of Co atoms, which, however, is significantly reduced when using a sapphire substrate. The Co layer is polycrystalline and shows larger grains for films grown on a sapphire substrate. The VSM investigation reveals in-plane anisotropy only for samples grown on a sapphire substrate. The FMR spectra of the TMJs are compared to the obtained ones with a single Co and Co2MnGe films of identical thickness deposited on a sapphire substrate. As expected, two distinct modes are detected in the TMJs while only one mode is observed in each single film. For the TMJ grown on a sapphire substrate the FMR behavior does not significantly differ from the superposition of the individual spectra of the single films, allowing for concluding that the exchange coupling between the two magnetic layers is too small to give rise to observable shifts. For TMJs grown on a Si or on a MgO substrate the resonance spectra reveal one mode which is nearly identical to the obtained one in the single Co film, while the other observed resonance shows a considerably smaller intensity and cannot be described using the magnetic parameters appropriate to the single Co2MnGe film.
SQUID magnetometry and polarised neutron reflectivity measurements have been employed to characterise the magnetic properties of U/Fe, U/Co and U/Gd multilayers. The field dependence of the magnetisation was measured at 10K in magnetic fields from -70kOe to 70kOe. A temperature dependent study of the magnetisation evolution was undertaken for a selection of U/Gd samples. PNR was carried out in a field of 4.4kOe for U/Fe and U/Co samples (at room temperature) and for U/Gd samples (at 10K). Magnetic dead layers of about 15 Angstrom were observed for U/Fe and U/Co samples, consistent with a picture of interdiffused interfaces. A large reduction in the magnetic moment, constant over a wide range of Gd layer thicknesses, was found for the U/Gd system (about 4 Bohr magnetons compared with 7.63 for the bulk metal). This could be understood on the basis of a pinning of Gd moments arising from a column-like growth mechanism of the Gd layers. A study of the effective anisotropy suggests that perpendicular magnetic anisotropy could occur in multilayers consisting of thick U and thin Gd layers. A reduction in the Curie temperature was observed as a function of Gd layer thickness, consistent with a finite-size scaling behaviour.
We study the introduction of a third material, namely Zr, within a nanometric periodic Mg/Co structure designed to work as optical component in the extreme UV (EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and Mg/Zr/Co/Zr multilayers are designed, then characterized in terms of structural quality and optical performances through X-ray and EUV reflectometry measurements respectively. For the Mg/Co/Zr structure, the reflectance value is equal to 50% at 25.1 nm and 45deg of grazing incidence and reaches 51.3% upon annealing at 200deg C. Measured EUV reflectivity values of tri-layered systems are discussed in terms of material order within a period and compared to the predictions of the theoretical model of Larruquert. Possible applications are pointed out.
This paper addresses the structural characterisation of a series of U/Fe, U/Co and U/Gd multilayers. X-ray reflectivity has been employed to investigate the layer thickness and roughness parameters along the growth direction and high-angle diffraction measurements have been used to determine the crystal structure and orientation of the layers. For the case of uranium/transition metal systems, the interfaces are diffuse and the transition metals are present in a polycrystalline form of their common bulk phases with a preferred orientation along the closest packed planes; Fe, bcc (110) and Co, hcp (001), respectively. The uranium is present in a poorly crystalline orthorhombic, alpha-U state. In contrast, the U/Gd multilayers have sharp interfaces with negligible intermixing of atomic species, and have a roughness, which is strongly dependent on the gadolinium layer thickness. Diffraction spectra indicate a high degree of crystallinity in both U and Gd layers with intensities consistent with the growth of a novel hcp U phase, stabilised by the hcp gadolinium layers.
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